Patents Assigned to Hitachi, Ltd. Hitachi Instrument Eng.
  • Patent number: 4728189
    Abstract: An absorption profile indicative of a relation in atomic absorption spectroscopy between the absorbance of a desired element and time has a constant half-width independent of the concentration of the desired element in a sample, and hence the half-width of absorption profile with respect to the desired element can be previously determined from data which is obtained by the measurement of a standard sample. In an atomic absorption spectrophotometer herein disclosed, the half-width of absorption profile is previously determined in the above-mentioned manner, and the true peak value of an absorption profile obtained by measuring a sample which contains the desired element at a high concentration, is calculated using the time width of this absorption profile at a predetermined absorbance and the previously-determined half-width.
    Type: Grant
    Filed: January 23, 1987
    Date of Patent: March 1, 1988
    Assignee: Hitachi, Ltd. Hitachi Instrument Eng.
    Inventors: Konosuke Oishi, Koichi Uchino, Hideo Yamada, Seigo Kamitake, Masao Hashimoto