Patents Assigned to HITOMI LTD
  • Patent number: 11711626
    Abstract: A method for rolling shutter compensation during signal delay measurement, comprising displaying a video test pattern on a display, said video test pattern having a temporal event; capturing a video of the display, by a camera; monitoring a plurality of regions of the display in the video; detecting times (1230, 1240) at which the temporal event appears in each monitored region of the display in the video; and extrapolating the detected times (1230, 1240) to calculate the time (1250) at which said temporal event would appear at a selected region of the video.
    Type: Grant
    Filed: September 7, 2020
    Date of Patent: July 25, 2023
    Assignee: HITOMI LTD
    Inventor: James Neil Robinson
  • Publication number: 20220353444
    Abstract: A method for rolling shutter compensation during signal delay measurement, comprising displaying a video test pattern on a display, said video test pattern having a temporal event; capturing a video of the display, by a camera; monitoring a plurality of regions of the display in the video; detecting times (1230, 1240) at which the temporal event appears in each monitored region of the display in the video; and extrapolating the detected times (1230, 1240) to calculate the time (1250) at which said temporal event would appear at a selected region of the video.
    Type: Application
    Filed: September 7, 2020
    Publication date: November 3, 2022
    Applicant: HITOMI LTD
    Inventor: James Neil ROBINSON
  • Publication number: 20220345689
    Abstract: A method for identifying variations introduced in signals transmitted over a signal path, the method comprising sending, over the signal path, one or more test patterns with functional features to a test pattern analyser, wherein said functional features are for determining aspects of variations introduced in the one or more test patterns during transmission over the signal path; and including a data pattern in at least one of the test patterns prior to said sending, said data pattern comprising meta-data on functional features of the at least one test pattern.
    Type: Application
    Filed: September 7, 2020
    Publication date: October 27, 2022
    Applicant: HITOMI LTD
    Inventor: James Neil ROBINSON