Patents Assigned to HOCHSCHULE MUNCHEN
  • Patent number: 8559680
    Abstract: The invention relates to a method for computer-aided segmentation of an environment into individual objects, in particular of a wood into individual trees, in which signals (SIG_R) backscattered by the objects are recorded by measurement technology, wherein the backscattered signals (SIG_R) result from the irradiation of the environment to be segmented with electromagnetic radiation. Furthermore, in the method according to the invention, spatial co-ordinates (x, y, z) of points which cause the backscattering and represent the object parts (X1, X2, . . . , X5) are determined from the backscattered signals (SIG_R), and a feature vector (f) is assigned to each of the points (P; P1, P2), which feature vector comprises at least the spatial co-ordinates (x, y, z) of the point in question (P; P1, P2). Then a distance measure (d) is determined for each of the feature vectors (f), which represents a similarity between the feature vectors (f) of two points (P; P1, P2).
    Type: Grant
    Filed: April 2, 2009
    Date of Patent: October 15, 2013
    Assignee: Hochschule Munchen
    Inventors: Claudius Schnorr, Peter Krzystek, Josef Reitberger, Volkan Oniz
  • Publication number: 20110305372
    Abstract: The invention relates to a method for computer-aided segmentation of an environment into individual objects, in particular of a wood into individual trees, in which signals (SIG_R) backscattered by the objects are recorded by measurement technology, wherein the backscattered signals (SIG_R) result from the irradiation of the environment to be segmented with electromagnetic radiation. Furthermore, in the method according to the invention, spatial co-ordinates (x, y, z) of points which cause the backscattering and represent the object parts (X1, X2, . . . , Xs) are determined from the backscattered signals (SIG_R), and a feature vector (f) is assigned to each of the points (P; P1, P2), which feature vector comprises at least the spatial co-ordinates (x, y, z) of the point in question (P; P1, P2). Then a distance measure (d) is determined for each of the feature vectors (f), which represents a similarity between the feature vectors (f) of two points (P; P1, P2).
    Type: Application
    Filed: April 2, 2009
    Publication date: December 15, 2011
    Applicant: HOCHSCHULE MUNCHEN
    Inventors: Claudius Schnorr, Peter Krzystek, Josef Reitberger, Volkan Oniz