Patents Assigned to Hokuto Electronics Incorporated
  • Patent number: 7929135
    Abstract: The size of particles is detected accurately and at low cost even when there are few microparticles as impurities included in a liquid. Provided is a method of detecting a size of particles in a liquid by detecting diffraction fringes appearing due to the particles in the liquid by a light detection portion. Diffraction fringes are detected by a first light detection portion and a second light detection portion that are separated along the flow direction of the liquid. A peak time difference (T2) that is a difference between times at which peak values appear in a detection signal from the first and second light detection portion is measured, and an area (SQ) based on the waveform of the detection signal is measured. The sizes of the particles included in the liquid are detected based on the peak time differences (T2) and the areas (SQ) that were measured.
    Type: Grant
    Filed: May 5, 2010
    Date of Patent: April 19, 2011
    Assignee: Hokuto Electronics Incorporated
    Inventors: Koichi Nakano, Yasuhiro Hayashi
  • Patent number: 6825649
    Abstract: It is possible to avoid the effects of floating capacitance, and to measure a voltage with a simple operation and in a non-contact manner, without measuring the floating capacitance.
    Type: Grant
    Filed: April 4, 2002
    Date of Patent: November 30, 2004
    Assignee: Hokuto Electronics Incorporated
    Inventor: Koichi Nakano