Abstract: This invention relates to the field of holography, in particular to a method and a device for recording optical holograms by means of amorphous molecular semiconductor (AMS) films deposited on a glass substrate pre-covered with a transparent electric conducting sub-layer. More precisely, the invention relates to a method and device for registering optical holograms on AMS-films which operates in such a way that the AMS-films possess the maximum achievable information parameters: Holographic sensitivity, optimal spatial frequency of the transmitted characteristic, band parameters for the spatial frequencies of the transmitted characteristic, “signal-to-noise” ratio in the restored holographic image, reference and object beam intensities ratio during hologram registration, and cycling ability.

Abstract: This invention relates to the field of holography, in particular to a method and a device for recording optical holograms by means of amorphous molecular semiconductor (AMS) films deposited on a glass substrate pre-covered with a transparent electric conducting sub-layer. More precisely, the invention relates to a method and device for registering optical holograms on AMS-films which operates in such a way that the AMS-films possess the maximum achievable information parameters: Holographic sensitivity, optimal spatial frequency of the transmitted characteristic, band parameters for the spatial frequencies of the transmitted characteristic, “signal-to-noise” ratio in the restored holographic image, reference and object beam intensities ratio during hologram registration, and cycling ability.

Abstract: This invention relates to a method and device for performing non-destructive measurements of residual stresses in an investigation area of an object based on use of optical holographic interferometry technique. The holographic interferometer is divided into a holographic probe which contains means for illuminating the investigation area of the object by coherent light, collecting the coherent light that scatters off this investigation area and means for performing a non-destructive dislocation release pulse of the residual stresses in a small region of the investigation area by exposing the object to an electric high currency, and a holographic camera which contains means for formation, registration, and development of a hologram and for formation of an interferogram of the investigation area of the object.

Abstract: This invention relates to a method and device for non-destructive testing of details, machine units and mechanisms, various materials, and in particular, to a method and device for non-destructive determination of residual stresses which are based on the optical holographic interferometry technique. First, a hologram of the investigation area of the object in its initial state is registered. Then the release of the residual stresses in an investigation point in the investigation area is performed by exposing the surface of the object to a high-current electric pulse with rectangular shape. Finally, an interferogram of the exact same area of the object is made, and the residual stresses at the investigation area are determined from the shape and size of the fringes in the interferogram.

Abstract: This invention relates to the field of holography, in particular to a method and a device for recording optical holograms by means of amorphous molecular semiconductor (AMS) films deposited on a glass substrate pre-covered with a transparent electric conducting sub-layer. More precisely, the invention relates to a method and device for registering optical holograms on AMS-films which operates in such a way that the AMS-films possess the maximum achievable information parameters: Holographic sensitivity, optimal spatial frequency of the transmitted characteristic, band parameters for the spatial frequencies of the transmitted characteristic, “signal-to-noise” ratio in the restored holographic image, reference and object beam intensities ratio during hologram registration, and cycling ability.