Abstract: A module and apparatus for measuring temperature related properties of an SRAM IC includes circuitry for controlling writing of data to and reading of data from a pair of SRAM ICs, one of which is a control and the other of which is the SRAM IC being tested. The circuitry includes an address counter, a logic controller, two input buffers, two output data latches, and a data comparator, the effect of temperature on data input through the input buffers under control of the logic controller and address counter being analyzed by comparing data output through the data latches. In addition, the apparatus includes two separate seats for the respective SRAM ICs, one of which is subjected to a constantly controlled temperature and the other of which is subjected to a varying ambient temperature.