Abstract: A testing card includes a power interface, a plurality of serial ports connected to a plurality of test instruments. The microprocessor includes a processing unit having been burnt with a plurality of test programs, the processing unit is configured to execute one of the test programs according a user selection and generate a test command, and a serial ports management unit configured to convert the test command into a control signal, and send the control signal to a corresponding test instrument via the corresponding one of the serial port to control the test instrument to test a target device. An electronic device using the test card is also provided.

Abstract: A central processing unit (CPU) test system includes a CPU socket, a CPU core controller, and a CPU test device. The CPU core controller stores a start voltage message. The CPU test device includes a voltage detection pin, an analog to digital (A/D) converter, and a microcontroller. The voltage detection pin detects a voltage of an electronic device connected to the CPU socket. The A/D converter converts the detected voltage into a digital signal. The microcontroller controls the CPU core controller to output the start voltage to the CPU socket according to the digital signal. The microcontroller stores a predetermined start voltage message. The microcontroller reads the start voltage message after controlling the CPU core controller to output the start voltage, and determines whether the CPU core controller supplies the start voltage to the CPU socket by comparing the read start voltage message with the predetermined start voltage message.