Patents Assigned to Horiba, Ltd.
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Patent number: 12044816Abstract: A radiation detector includes a radiation detection element, a circuit element, and a housing accommodating the radiation detection element and the circuit element, in which a closed space is provided. The housing has an unblocked opening portion, the closed space is disposed inside the housing, the circuit element is disposed in the closed space, and the closed space is decompressed or filled with an inert gas or a dry gas.Type: GrantFiled: March 28, 2022Date of Patent: July 23, 2024Assignee: HORIBA, LTD.Inventors: Daisuke Matsunaga, Seiji Ikawa, Yuji Okubo
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Patent number: 12019037Abstract: A signal processing method counting step waves in response to detection of radiation or pulse waves obtained by converting the step waves by wave height, comprising: inputting signal value sequence in response to the detection of the radiation to a learning model outputting, when time-series signal value sequence is input, information related to presence or absence of the step wave or the pulse wave in a signal configured with the signal value sequence or information related to a wave height of the step wave or the pulse wave in the signal; and counting the step wave or the pulse wave by wave height according to the information output by the learning model.Type: GrantFiled: March 18, 2021Date of Patent: June 25, 2024Assignee: HORIBA, LTD.Inventor: Shunsuke Murata
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Publication number: 20240204223Abstract: Provided is an evaluation device that evaluates performance of a predetermined object to be evaluated by varying a temperature condition. The evaluation device comprises a heating furnace having a furnace inner space that houses the object to be evaluated, a temperature adjusting mechanism that adjusts a temperature of the object to be evaluated or its surroundings by heating or cooling, a temperature acquisition unit that acquires the temperatures of a plurality of locations of the object to be evaluated or its surroundings, and a temperature adjusting mechanism control unit that controls the temperature adjusting mechanism to keep an absolute value of a temperature difference between the temperatures of a plurality of the locations acquired by the temperature acquisition unit lower than or equal to a predetermined value.Type: ApplicationFiled: April 11, 2022Publication date: June 20, 2024Applicant: HORIBA, LTD.Inventor: Takahiro ITAYA
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Publication number: 20240194909Abstract: There is provided a hydrogen consumption quantity measurement system that, even in a case in which there is a possibility that leakage hydrogen is contained in exhaust gas from a fuel cell or a hydrogen engine, makes it possible to accurately determine a total quantity of hydrogen consumption of the fuel cell without having to modify a vehicle or the like. This hydrogen consumption quantity measurement system measures a hydrogen consumption quantity in a test body, which is formed by a moving body or portion thereof that includes a hydrogen reactor that causes hydrogen to undergo a chemical reaction, and that utilizes energy obtained from this chemical reaction, and includes an oxygen concentration sensor that measures a concentration of oxygen contained in exhaust gas from the test body.Type: ApplicationFiled: March 31, 2022Publication date: June 13, 2024Applicant: HORIBA, LTD.Inventors: Takuji OIDA, Shigeru NAKATANI, Junichi AOYAMA, Yoshihiro YOKOTA
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Patent number: 11993249Abstract: The present invention makes it possible to reduce the burden on a user in vehicle testing while maintaining precision of vehicle testing, and is a vehicle testing system for testing, on a test bench, a vehicle or a test piece that is a portion of a vehicle, the vehicle testing system being provided with a camera for capturing an image of a portion of a test piece, and a control device for controlling vehicle testing on the basis of the image captured by the camera.Type: GrantFiled: November 28, 2019Date of Patent: May 28, 2024Assignee: Horiba, Ltd.Inventor: Kazuki Furukawa
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Publication number: 20240159686Abstract: The present invention reduces erroneous detection due to diffracted light from a pattern, and provides a particle inspection device that inspects a particle adhering to a substrate on which a pattern is formed, including: a light irradiation unit that linearly scans and irradiate the substrate with a laser beam; a first light detection unit and a second light detection unit that detect light reflected by the substrate; and a particle detection unit that detects the particle based on output signals of the first light detection unit and the second light detection unit, in which the first light detection unit and the second light detection unit are arranged such that a light reception elevation angle ? with respect to a surface of the substrate and a light reception horizontal angle ? with respect to a scanning direction of the laser beam are different from each other.Type: ApplicationFiled: February 7, 2022Publication date: May 16, 2024Applicant: HORIBA, LTD.Inventors: Shota SOMEYA, Toyoki KANZAKI
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Publication number: 20240145744Abstract: The present invention is a fuel cell evaluation system that obtains an actual gas consumption amount in a fuel cell in real time with accuracy and calculates a consumption amount of a fuel gas in the fuel cell, the fuel cell evaluation system including: a fuel gas supply path that supplies a fuel gas of a first flow rate to the fuel cell; a fuel gas discharge path that discharges the fuel gas from the fuel cell; an inert gas introduction path that introduces an inert gas of a second flow rate into the fuel gas discharge path or the fuel gas supply path; a first fuel gas concentration meter that measures a fuel gas concentration in a mixed gas of the fuel gas and the inert gas flowing through the fuel gas discharge path; and a fuel gas consumption amount calculation unit that calculates the consumption amount of the fuel gas in the fuel cell based on the first flow rate, the second flow rate, and the fuel gas concentration measured by the first fuel gas concentration meter.Type: ApplicationFiled: March 14, 2022Publication date: May 2, 2024Applicant: HORIBA, LTD.Inventors: Yoichi OKADA, Yoshinori TANAKA, Kohei SASAI, Shunta WATANABE
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Publication number: 20240146020Abstract: To suppress individual differences in intensity of output laser light for each semiconductor laser device as much as possible while suppressing generation of stray light in a package of the semiconductor laser device, provided is a semiconductor laser device used for optical analysis, including: a package that accommodates a semiconductor laser element therein; and a light reflection reducing member that is provided inside the package and suppresses reflection of light emitted from the semiconductor laser element, in which the light reflection reducing member is bonded to an inner surface of the package.Type: ApplicationFiled: February 21, 2022Publication date: May 2, 2024Applicant: HORIBA, LTD.Inventors: Yusuke AWANE, Makoto MATSUHAMA, Kosuke TSUKATANI, Kodai NIINA, Takuya IDO
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Patent number: 11971339Abstract: A particle size distribution measurement device includes a cell holding body 31 that holds a measurement cell 2 containing a measurement sample and a dispersion medium and a reference cell 6 containing a reference sample and is rotated by a motor 322, and a cell discrimination mechanism 7 that discriminates the cells 2, 6 passing through a predetermined rotation position by using a magnetic force or electrostatic capacitance.Type: GrantFiled: October 29, 2019Date of Patent: April 30, 2024Assignees: Horiba, Ltd., Eppendorf Himac Technologies Co., Ltd.Inventors: Tetsuji Yamaguchi, Hitoshi Watanabe, Hidetaka Osawa, Ken Asakura, Kenichi Nemoto
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Patent number: 11949210Abstract: The present invention relates to a semiconductor laser device capable of reducing a measurement error of a temperature detecting element for detecting the temperature of a semiconductor laser element and accurately controlling the temperature of the semiconductor laser element. The semiconductor laser device is used for optical analysis and includes: a semiconductor laser element; a temperature detecting element that detects the temperature of the semiconductor laser element; output terminals that output the output of the temperature detecting element to the outside; wires that electrically connect the temperature detecting element and the output terminals; and a heat capacity increasing part that is provided interposed between the temperature detecting element and output terminal, and the output terminal, and contacts with at least part of the wires to increase the heat capacity of the wires.Type: GrantFiled: March 6, 2020Date of Patent: April 2, 2024Assignee: Horiba, Ltd.Inventors: Makoto Matsuhama, Yusuke Awane, Kimihiko Arimoto, Hirotaka Iseki, Shintaro Masuda
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Patent number: 11940397Abstract: The radiation detection device includes: a sample holding unit; an optical microscope configured to observe a sample held by the sample holding unit; an irradiation unit that irradiates the sample with radiation; a detection unit that detects radiation generated from the sample; an adjustment unit that adjusts a relationship between a focal position of the optical microscope and a position of the sample such that the optical microscope is focused on one portion of the sample; a change unit that changes a position, on which the optical microscope is to be focused, on the sample; an imaging unit that creates a partial image captured by the optical microscope at the changed position on the sample in a state in which the adjustment unit performs adjustment for focusing; and a sample image creation unit that creates a sample image by combining a plurality of partial images created by the imaging unit.Type: GrantFiled: June 6, 2019Date of Patent: March 26, 2024Assignee: HORIBA, LTD.Inventor: Tomoki Aoyama
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Publication number: 20240034339Abstract: The present invention aims to improve the efficiency of automobile development by front loading the evaluation of an on-road driving test, and comprises a virtual evaluation step of simulating the on-road driving test using a driving environment model which models a driving environment, an operating state model which models an operating state, and a vehicle model which models the actual vehicle; a bench test evaluation step of imitating the on-road driving test by combining a part or all of the actual vehicle, a part or all of the vehicle model, a part or all of the driving environment model, and a part or all of the operating state model, and conducting a bench test of a part or all of the actual vehicle, and an on-road driving test evaluation step of conducting the on-road driving test of the actual vehicle in a real driving environment.Type: ApplicationFiled: February 3, 2022Publication date: February 1, 2024Applicant: HORIBA, LTD.Inventors: Philip ROBERTS, Kunio TABATA, Steven WHELAN, Aaron HEADLEY
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Publication number: 20240035934Abstract: In order to make it possible to measure a brake dust amount and the like even when a main flow rate is fluctuated, a brake dust measurement device that measures brake dust generated from a brake includes: a main flow path through which a sample gas containing the brake dust flows; a sampling flow path that is connected to a sampling point set in the main flow path and collects a part of the sample gas; and a flow rate control mechanism that controls a sampling flow rate that is a flow rate in the sampling flow path such that the sampling flow rate coincides with a flow rate proportional to a main flow rate that is a flow rate in the main flow path.Type: ApplicationFiled: November 12, 2021Publication date: February 1, 2024Applicants: HORIBA, LTD., HORIBA Europe GmbHInventors: Yoshinori OTSUKI, Joel DANZER, Dmytro LUGOVYY
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Publication number: 20240030683Abstract: The present invention enables single mode light to be stably output while also enabling the intensity thereof to be increased, and is a distributed feedback type of semiconductor laser element in which a diffraction grating is formed on a waveguide. The waveguide includes a diffraction grating portion where the diffraction grating is formed, and a flat portion having a region where the diffraction grating is not formed and whose width is broader than the diffraction grating portion. The flat portion has a connecting portion having a region whose width changes continuously approaching a connection location with the diffraction grating portion, and a high-reflection film is provided on an end surface of the flat portion that is on an opposite side from the connecting portion, while an anti-reflection film is provided on an end surface of the diffraction grating portion that is on an opposite side from the connecting portion.Type: ApplicationFiled: December 2, 2021Publication date: January 25, 2024Applicant: HORIBA, LTD.Inventors: Makoto MATSUHAMA, Tomoji TERAKADO, Yusuke AWANE
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Patent number: 11879822Abstract: To enable the particle size distribution of a measurement target to be accurately measured regardless of the presence of a particle which is similar in shape to the measurement target and which is not the measurement target, a particle size distribution measuring device includes an image processing unit that receives image data obtained by capturing an image of a particle group including a first particle and a second particle of a type different from the first particle, at least the first particle being translucent; and a particle discriminating unit that discriminates whether a particle depicted in the image is the first particle or the second particle on the basis of light and dark regions that appear as a result of refraction of light passing through the particle.Type: GrantFiled: May 27, 2019Date of Patent: January 23, 2024Assignee: HORIBA, LTD.Inventors: Hisashi Akiyama, Tetsuya Mori, Eiichi Nagaoka
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Publication number: 20230417660Abstract: The present invention is a gas analysis device that measures a concentration or partial pressure of a halide contained in a material gas used in semiconductor manufacturing process or a by-product gas generated in semiconductor manufacturing process with good accuracy, the device being for analyzing a concentration or partial pressure of a halide contained in a material gas used in a semiconductor manufacturing process or a by-product gas generated in a semiconductor manufacturing process, the device including a gas cell into which the material gas or the by-product gas is introduced, a laser light source that irradiates the gas cell with laser light whose wavelength is modulated, a light detector that detects the laser light transmitted through the gas cell, and a signal processing unit that calculates the concentration or partial pressure of the halide by using a light absorption signal obtained from an output signal of the light detector.Type: ApplicationFiled: November 22, 2021Publication date: December 28, 2023Applicants: HORIBA STEC, Co., Ltd., HORIBA, LTD.Inventors: Yuhei SAKAGUCHI, Masakazu MINAMI, Kyoji SHIBUYA, Motonobu TAKAHASHI
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Publication number: 20230401904Abstract: A test system for testing a test piece that is a vehicle or a part of the vehicle including a sensor and an electronic control device including a vehicle diagnostic function that acquires an output signal from the sensor, and that makes a diagnosis of the vehicle or the part of the vehicle, the test system includes a simulation signal generation device that is provided on a line between the sensor and the electronic control device, and that outputs a simulation signal simulating an output signal from the sensor to the electronic control device, a control unit that controls the simulation signal generation device to generate a simulation signal, and a storage unit that stores therein the generated simulation signal and an output signal that is output from the electronic control device in response to an input of the simulation signal, in a manner associated with each other.Type: ApplicationFiled: August 18, 2021Publication date: December 14, 2023Applicant: HORIBA, LTD.Inventors: Hiroyuki IKEDA, Tatsuya YOSHIMURA
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Publication number: 20230375503Abstract: A gas analysis device that comprises a first flow channel through which a sample gas flows, a first analyzer that is arranged in the first flow channel and that performs wet-measurement of a total hydrocarbon concentration in the sample gas, a second flow channel through which the sample gas flows, a non-methane cutter that is arranged in the second flow channel and that removes a hydrocarbon component other than methane in the sample gas, a second analyzer that is arranged downstream of the non-methane cutter in the second flow channel and that performs dry-measurement of a concentration of methane in the sample gas, and a calculation section that calculates a concentration of the hydrocarbon component other than methane in the sample gas using the total hydrocarbon concentration obtained by the first analyzer and a corrected concentration of methane, which is a moisture corrected methane concentration, obtained by the second analyzer.Type: ApplicationFiled: October 6, 2021Publication date: November 23, 2023Applicant: HORIBA, LTD.Inventors: Ryota OCHIAI, Tomoshi YOSHIMURA, Ma Camille Corrales LACDAN
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Publication number: 20230366827Abstract: An exhaust gas analysis device analyzes exhaust gas generated when fuel is combusted. This exhaust gas analysis device includes a first analyzer that measures a concentration of a component to be measured in the exhaust gas, a second analyzer that measures a concentration of CO2 in the exhaust gas, a storage portion that stores a hydrogen/carbon ratio, which is a ratio between hydrogen and carbon composing the fuel, or an input receiving portion that receives an input of the hydrogen/carbon ratio, a moisture concentration estimating portion that, based on the measured CO2 concentration and on the hydrogen/carbon ratio of the fuel, estimates a concentration of moisture in the exhaust gas, and a correcting portion that, based on the estimated moisture concentration, corrects the measured concentration of the component to be measured.Type: ApplicationFiled: September 22, 2021Publication date: November 16, 2023Applicant: HORIBA, LTD.Inventors: Tomohiko ISHIZAKI, Tomoshi YOSHIMURA
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Publication number: 20230338994Abstract: In order to obtain a contaminant removal device capable of improving contaminant removal performance regardless of a structure formed on a surface of an object, in the contaminant removal device, contaminant attached to the object is removed by a gas sprayed out of a nozzle having a gas outlet, and an aperture ratio of opposing end portions of the gas outlet is set smaller than an aperture ratio of a central portion of the gas outlet.Type: ApplicationFiled: August 26, 2021Publication date: October 26, 2023Applicants: DENSO CORPORATION, HORIBA, LTD.Inventors: Takanori NAKAMURA, Daisaku SUGI, Daisuke UKI, Takahiro KAWANO, Toyoki KANZAKI