Patents Assigned to Horiba, Ltd.
  • Patent number: 6061131
    Abstract: A light scattering particle size distribution measuring apparatus inches a light source for providing a beam of light to contact with a sample cell holding a specimen. A detector assembly includes a first set of detector assembly includes a first set of detector elements for receiving scattered and/or diffracted light from the sample cell and a second set of detector elements positioned between the first set of detector elements. A removable scattering and/or diffracting target member can be positioned on the optical axis to provide a predetermined scattered and/or diffraction pattern to the detector assembly whereby the second set of detector elements can measure the predetermined fraction pattern to enable a movement of one of the light source and the detector assembly to align them on an optical axis.
    Type: Grant
    Filed: January 8, 1997
    Date of Patent: May 9, 2000
    Assignee: Horiba, Ltd.
    Inventors: Tatsuo Igushi, Yoshiaki Togawa
  • Patent number: 6054098
    Abstract: This invention provides an apparatus for measuring ozone in which interference effects of SO.sub.2 are intended to be reduced. This invention comprises a reference gas line for generating reference gas with ozone removed by allowing the sample gas to pass through the ozone decomposer with silver wool used as a catalyst, a sample gas line for introducing the sample gas as it is, an ozone analyzer to which the reference gas line and the sample gas line are connected via a selector valve and which measures the ozone component in the sample gas by introducing the reference gas and the sample gas alternately at specified intervals, and a temperature controller installed to the ozone decomposer for setting the catalyst reaction temperature to a range from 100 to 130.degree. C.
    Type: Grant
    Filed: July 24, 1998
    Date of Patent: April 25, 2000
    Assignee: Horiba, Ltd.
    Inventors: Junji Kato, Toshikazu Ohnishi
  • Patent number: 6052431
    Abstract: An X-ray converging mirror that can be positioned adjacent an X-ray source for reflecting X-ray beams from the X-ray source includes an X-ray converging mirror having a reflecting surface of a cross-sectional profile expressed by a curve of the following equation:x=y tan .theta.[1-ln(y/b)]wherein x and y denote a coordinate system, .theta. is equal to or less than a Bragg critical angle of reflection for the X-ray beams, and b denotes a point on the y-axis when dx/dy is 0.
    Type: Grant
    Filed: June 5, 1998
    Date of Patent: April 18, 2000
    Assignee: Horiba, Ltd.
    Inventors: Akira Onoguchi, Kozo Kashihara
  • Patent number: 6030845
    Abstract: An immunoassay method in which blood can be measured even without pretreatment by a centrifuge etc. In the present invention, antibodies or antigens in a sample are subjected to agglutination reaction with insoluble carriers onto which antigens or antibodies specifically reacting with the antibodies or antigens in the sample have been imrobilized and the resulting agglutination mixture is determined for the change in its absorbance or in its scattered light by irradiation with light, wherein said sample is whole blood and the whole blood is forcibly lysed.
    Type: Grant
    Filed: July 28, 1997
    Date of Patent: February 29, 2000
    Assignee: Horiba Ltd.
    Inventors: Yasuo Yamao, Narihiro Oku
  • Patent number: 5976889
    Abstract: A method and apparatus for detecting NO.sub.x by chemiluminescence. The apparatus includes a sample gas line having an inlet port for receiving a sample gas, a NO.sub.x converter connected to the sample gas line, a N.sub.2 diluting gas line connected to the sample gas line upstream from the NO.sub.x converter, a bypass exhaust lie connected to the sample gas line, and a chemiluminescence analyzer connected to the NO.sub.x converter. The sample gas, which contains a NO.sub.x component, is introduced to the sample gas line through an inlet portion. The sample gas is diluted with nitrogen gas from the nitrogen diluting gas line, and the NO.sub.x component in the sample gas is converted to NO by the NO.sub.x converter. The chemiluminescence analyzer detects the NO.sub.x component.
    Type: Grant
    Filed: October 8, 1997
    Date of Patent: November 2, 1999
    Assignee: Horiba Ltd.
    Inventors: Hitoshi Hirai, Masaru Miyai
  • Patent number: 5970163
    Abstract: A method of measuring microbial activity of microbes in real time includes preparing a medium to enable microbial activity and placing the medium in operative contact with an appropriate sensor. The sensor is scanned to provide measurement electrical signals representative of position and amount of microbial activity, the sensor being responsive to a by-product of the microbial activity, such as a change in pH. The measurement signals can then be processed to provide a visual image display, and the display can visually distinguish between levels of pH activity and coordinate positions of the microbial activity.
    Type: Grant
    Filed: May 31, 1996
    Date of Patent: October 19, 1999
    Assignee: Horiba, Ltd.
    Inventors: Hiroshi Iwasaki, Tomoaki Fukushige, Hirofumi Akano, Satoshi Nomura, Katsuhiko Tomita
  • Patent number: 5966676
    Abstract: A calibration-inability warning method in an analyzing apparatus determines in advance when the analyzing apparatus approaches a calibration-inability condition prior to entering calibration inability condition. To do so, coefficient ranges are set, and a calibration coefficient is computed. It is then determined whether the calibration coefficient is within a normal calibration range, a calibration-inability range, or a normal calibration range with no allowance. Signals are generated indicating that the calibration-inability condition is approaching when the calibration coefficient becomes a certain value in the vicinity of the calibration-inability range.
    Type: Grant
    Filed: June 26, 1996
    Date of Patent: October 12, 1999
    Assignee: Horiba Ltd.
    Inventors: Masahiko Fujiwara, Kiyomi Shiotani
  • Patent number: 5939610
    Abstract: An ion concentration measuring apparatus having a housing member with a measuring electrode assembly movably mounted within the housing member is provided. A calibration fluid reservoir is also mounted within the housing member. The measuring electrode assembly can be extended for a measuring mode of operation of retracted within the housing member and appropriately sealed so that it will contact the calibration fluid for a calibration operation.
    Type: Grant
    Filed: July 8, 1996
    Date of Patent: August 17, 1999
    Assignee: Horiba, Ltd.
    Inventors: Yasukazu Iwamoto, Hiromi Ohkawa
  • Patent number: 5936729
    Abstract: An improved photo detector assembly for a particle size distribution measuring equipment provides a unitary opaque coating deposited above a photo detector layer with a plurality of concentric apertures that can be defined with high precision about a concentric center. The masking can be applied in a production environment to ensure high accuracy and a compact size.
    Type: Grant
    Filed: March 25, 1997
    Date of Patent: August 10, 1999
    Assignee: Horiba, Ltd.
    Inventor: Tatsuo Igushi
  • Patent number: 5886347
    Abstract: An analytical method capable of easily, rapidly, and accurately determining concentrations of a multi-component aqueous solution. Near-infrared spectra of a standard solution containing k components of known concentrations are measured n times within a range of 1,500 to 1,850 nm. A loading matrix of p columns by m rows and an intermediate matrix of k columns by m rows for an appointed factor number m are obtained from a response matrix of p columns by n rows consisting of p absorbance values of the respective spectra in a calibration stage and p absorbance values of a near-infrared spectrum within a wavelength range of 1,500 to 1,850 nm of a test liquid. The test liquid contains k components including pure water of unknown concentrations. The concentrations of the k components are determined from a group of absorbance values and the loading and intermediate matrices obtained in the calibration stage by a matrix operation in an prediction stage.
    Type: Grant
    Filed: July 13, 1995
    Date of Patent: March 23, 1999
    Assignee: Horiba, Ltd.
    Inventors: Masaru Inoue, Juichiro Ukon, Issei Yokoyama, Takashi Hagiwara
  • Patent number: 5870193
    Abstract: An infrared spectrometer disperses a radiation ray from a catalyst which has been exposed to a gas for evaluation to adsorb adsorbates thereon, and outputs spectral data in accordance with a wavenumber of the radiation ray to a computer storing reference data. The computer normalizes the spectral data and the reference data, and then, it calculates a product of the normalized spectral data and the reference data. Thereafter, a function of the product is differentiated with respect to the wavenumber to obtain a differential function. Accordingly, a specified wavenumber for which the differential function is zero is determined, so that the common peak of the spectral data and the reference data at the specified wavenumber is accurately determined.
    Type: Grant
    Filed: October 6, 1997
    Date of Patent: February 9, 1999
    Assignees: Nippon Soken, Inc., Horiba, Ltd.
    Inventors: Atsuhiro Sumiya, Itsuhei Ogata, Tsukasa Satake, Juichiro Ukon
  • Patent number: 5866903
    Abstract: This invention provides a quantitative X-ray analyzing system and process for scanning a sample with a beam of radiation includes an X-ray detector for detecting characteristic X-rays generated when a sample is scanned. A computer processor for processing outputs of the X-ray detector to determine concentration values of elements in the sample corresponding to a scanned pixel position of the sample. A memory stores the concentration values and the processor can then map the elements in background for phase analysis and grouping of the elements in the background by composition based on the contents of the memory wherein each map point is quantitatively operated to find a determined value of each group and in addition the area ratio of each group is found, and then, based on the density of the detected elements and to determine the value of each group, an area ratio is converted to a weight ratio for each group.
    Type: Grant
    Filed: May 9, 1997
    Date of Patent: February 2, 1999
    Assignee: Horiba, Ltd.
    Inventors: Yoji Morita, Jun Murase, Katsuhiro Yoshimitsu, Kenichi Watanabe
  • Patent number: 5814280
    Abstract: A pH sensor having an ISFET is provided on a crystalline substrate of silicon with a thin film of aluminum oxide formed to have epitaxial growth with an overlaying thin film of silicon epitaxial grown on the aluminum oxide layer. A source element and a drain element are provided on the silicon film, and a pH responsive film layer is connected to the source and drain. The pH sensor can be accompanied with appropriate circuitry also integrally formed on the same epitaxial SOI substrate.
    Type: Grant
    Filed: November 21, 1996
    Date of Patent: September 29, 1998
    Assignee: Horiba, Ltd
    Inventors: Katsuhiko Tomita, Tsuyoshi Nakanishi, Syuji Takamatsu, Satoshi Nomura, Hiroki Tanabe
  • Patent number: 5807426
    Abstract: The present invention enables the dissipation of thermal energy from a gas chromatography chamber containing a gas chromatography sample by providing the housing in two parts so that ambient air can be bled in during a creation of thermal energy with a heater and additional ambient air can be circulated in a cooling cycle. Additionally, a heat exchanger for receiving liquid nitrogen can also be included to increase the speed in which thermal energy can be dissipated.
    Type: Grant
    Filed: November 19, 1996
    Date of Patent: September 15, 1998
    Assignee: Horiba, Ltd.
    Inventors: Satoshi Ohtsuki, Tsutomu Oie
  • Patent number: 5796475
    Abstract: A signal processing method and an improved defect detecting apparatus which scans a circuit substrate with a laser beam is provided to enable a distinction between a circuit pattern signal and a defect signal. A laser beam is scanned across the surface of a substrate with the reflected light picked up by a photodetector. The photodetector provides an output signal that can comprise both a pattern signal and a defect signal. This output signal is applied to a first signal processing line having a low-pass filter characteristic and a second signal processing line without a low-pass filter characteristic. The signals can be appropriately amplified and/or delayed and are finally submitted to a subtraction circuit so that the resulting output signal enables a ready determination of a defect apart from the existence of any pattern signal.
    Type: Grant
    Filed: February 12, 1997
    Date of Patent: August 18, 1998
    Assignee: Horiba, Ltd.
    Inventors: Toyoki Kanzaki, Dainichiro Kinoshita
  • Patent number: 5796480
    Abstract: Particle size distribution measuring equipment includes a flow cell that can be illuminated with light so that suspended particles can scatter the light and thereby measure both particle size and frequency. A dispenser unit is connected to the flow cell for delivering a sample. A fractionator unit can pretreat the sample to provide particles over a predetermined size in a sealed chamber resulting from the impact of compressed air. The fractionated sample can be delivered to the dispenser, and a controller can automatically coordinate the preparation of the dispenser unit, the flow cell, the measuring of scattered light, and the release of the fractionated sample from the sealed chamber.
    Type: Grant
    Filed: November 22, 1996
    Date of Patent: August 18, 1998
    Assignee: Horiba, Ltd.
    Inventor: Tatsuo Igushi
  • Patent number: 5789721
    Abstract: A high-frequency induction heater having a working coil for providing a high-frequency application of power to a sample is provided with a control circuit for controlling the amount of power to the working coil. A phase control member can be triggered to provide a first level of power to the sample to heat it below its combustion level, to thereby remove any exterior stains. Subsequently, a second level of power can be applied for a predetermined period of time to heat it to a combustion point whereby the combustion gases of the sample are free from any byproducts of the stain and an accurate measurement can be accomplished.
    Type: Grant
    Filed: May 30, 1995
    Date of Patent: August 4, 1998
    Assignee: Horiba, Ltd.
    Inventors: Morinobu Hayashi, Koichi Nagai, Akihiro Hirano
  • Patent number: 5780716
    Abstract: A gas analyzing apparatus includes a sample gas line with a sample line valve for providing a sample gas, and a reference gas line with a reference line valve for providing a reference gas. A first gas analyzer is connected to the sample line downstream of the sample line valve, and a second gas analyzer is connected to both the sample and reference gas lines downstream of the valves. The lines are configured such that sample gas and reference gas may be alternately provided to the second gas analyzer either directly or indirectly via the first gas analyzer.
    Type: Grant
    Filed: August 22, 1996
    Date of Patent: July 14, 1998
    Assignee: Horiba, Ltd.
    Inventors: Naohito Shimizu, Shigeyuki Akiyama, Masahiko Fujiwara, Satoshi Inoue, Takuji Oida
  • Patent number: 5773828
    Abstract: A gas analyzer has a simple composition and can measure multi-components at a high accuracy. A plurality of measuring cells, including a case where the cells are different in length from each other, communicate sequentially with each other through a communication part to form a single gas path. A cut-on filter as an infrared penetration/reflection means for diffracting spectrally an infrared wavelength is provided on a light source side. A NO.sub.X measuring cell 3 having a cell length of about 60 mm and a CO.sub.2 measuring cell 7 having a cell length of about 1 mm which communicate through the communication part with each other, and a capacitor microphone (an infrared-ray detector for NO.sub.X) and a pyroelectric detector (an infrared-ray detector for CO.sub.2) are provided on the infrared penetration and reflection sides of the optical filter.
    Type: Grant
    Filed: February 23, 1996
    Date of Patent: June 30, 1998
    Assignee: Horiba, Ltd.
    Inventors: Shigeyuki Akiyama, Masahiko Fujiwara, Takuji Oida, Naohito Shimizu, Aritoshi Yoneda, Toshikazu Ohnishi
  • Patent number: 5746976
    Abstract: A detachable gas analyzing apparatus has a plurality of gas analyzer units insertable into and removable from a the front side of a container case. Complementary electrical and gas connectors are disposed on the rear side of the gas analyzer units and the container case. Guides and engaging rails guide the gas analyzer units as they are inserted into the container case. The gas connectors are substantially self-aligning by the provision of complementary tapered portions formed on gas sockets and plugs. The gas connectors also align the electrical connectors and provide compensation for linear misalignment. A plurality of gas connectors may also be employed, forming a number of inward and outward gas passages.
    Type: Grant
    Filed: December 15, 1995
    Date of Patent: May 5, 1998
    Assignee: Horiba Ltd.
    Inventors: Shinsaku Yamada, Hideki Ohashi, Sumio Shimizu, Takao Imaki