Abstract: A surveying type target has a precisely located aperture that achieves tolerances, within +/?0.0005 inch, in the assembly and usage of a retro-reflective photogrammetry target for use with close range industrial photogrammetry. The dot the target may also be refurbished and reconditioned in the field under all weather conditions. This target has a precisely machined ring that fits into a precisely machined socket of a body to eliminate assembly irregularities. This target precisely locates the ring upon the body forming a finished target with a known centerline and height location within +/?0.0005 inch tolerance.
Abstract: An infrared target for use with indoor industrial G.P.S. has at least one mask or overlay applied to the lens of the target. The mask increases the precision of setting the location of any instrument, assembly, machinery, or component to be machined, during industrial applications. The mask improves position tolerances to 0.0005 inch or less. Further, a reflective ring positioned upon the overlay serves as a marker for laser light at lesser tolerance than the overlay.
Abstract: A track and punch SMR marking device, including a base, the base mounts for adjustment an SMR (spherically mounted retro-reflector), which in cooperation with a laser tracker beam locates the device precisely over an area where a punch mark is to be made, the base includes an upright sleeve, for holding a striker shaft, the striker shaft, at its lower end, includes a bevel, mating with the inclined surface of a cross slide, the cross slide, when it is urged forwardly, depresses a punch forcing it downwardly so as to provide a punch point or indentation upon the component to be worked.
Type:
Grant
Filed:
February 13, 2006
Date of Patent:
April 17, 2007
Assignee:
Hubbs Machine & Manufacturing Co. Pro Corp.