Patents Assigned to HUNAN GREAT-LEO MICROELECTRONICS CO., LTD.
  • Patent number: 11852666
    Abstract: Disclosed are circuit and method for width measurement of digital pulse signals. The circuit comprises: a sample clock, used to drive all registers in the circuit; an edge detection and interrupt control unit, used to detect a rising edge and a falling edge of a pulse signal on an input pin Input to control signal collection; an integer encoding unit comprising a counter and registers and used to measure an integer part ? of the width of a high or low level on the input pin Input with one period 1/f of the sample clock as a reference unit; a signal capture chain, used to sample an output level of each delay cell DLL; a decimal encoding unit, used to find out and record the propagation position of the pulse edge on the signal capture chain; and a calibration control unit, used to perform calibration.
    Type: Grant
    Filed: April 25, 2021
    Date of Patent: December 26, 2023
    Assignee: HUNAN GREAT-LEO MICROELECTRONICS CO., LTD.
    Inventors: Hu Chen, Ye Xu, Jianghua Wan
  • Patent number: 11695396
    Abstract: A circuit, for generating ultrahigh-precision digital pulse signals comprises: a pulse edge control circuit used for delaying a signal on an input pin and accurately controlling positions of a rising edge and a falling edge of the pulse signal to accurately control the width of pulses and generate ultrahigh-precision pulses; a static calibration circuit used for calculating step size information representing the relationship between a work clock period of a system and a delay of delay cells in the pulse edge control circuit when the system is powered on to work, and storing the step size information, wherein the step size information is the number of delay cells through which the signal is propagated and passes within one system clock period; and a dynamic calibration circuit used for dynamically calculating step size information when a rising edge or a falling edge of each pulse in the input pin arrives.
    Type: Grant
    Filed: January 29, 2021
    Date of Patent: July 4, 2023
    Assignee: HUNAN GREAT-LEO MICROELECTRONICS CO., LTD.
    Inventors: Hu Chen, Ye Xu, Jianghua Wan
  • Publication number: 20220308102
    Abstract: Disclosed are circuit and method for width measurement of digital pulse signals. The circuit comprises: a sample clock, used to drive all registers in the circuit; an edge detection and interrupt control unit, used to detect a rising edge and a falling edge of a pulse signal on an input pin Input to control signal collection; an integer encoding unit comprising a counter and registers and used to measure an integer part ? of the width of a high or low level on the input pin Input with one period 1/f of the sample clock as a reference unit; a signal capture chain, used to sample an output level of each delay cell DLL; a decimal encoding unit, used to find out and record the propagation position of the pulse edge on the signal capture chain; and a calibration control unit, used to perform calibration.
    Type: Application
    Filed: April 25, 2021
    Publication date: September 29, 2022
    Applicant: HUNAN GREAT-LEO MICROELECTRONICS CO., LTD.
    Inventors: Hu CHEN, Ye XU, Jianghua WAN
  • Publication number: 20220173727
    Abstract: A circuit, for generating ultrahigh-precision digital pulse signals, comprises: a pulse edge control circuit used for delaying a signal on an input pin and accurately controlling positions of a rising edge and a falling edge of the pulse signal to accurately control the width of pulses and generate ultrahigh-precision pulses; a static calibration circuit used for calculating step size information representing the relationship between a work clock period of a system and a delay of delay cells in the pulse edge control circuit when the system is powered on to work, and storing the step size information, wherein the step size information is the number of delay cells through which the signal is propagated and passes within one system clock period; and a dynamic calibration circuit used for dynamically calculating step size information when a rising edge or a falling edge of each pulse in the input pin arrives.
    Type: Application
    Filed: January 29, 2021
    Publication date: June 2, 2022
    Applicant: HUNAN GREAT-LEO MICROELECTRONICS CO., LTD.
    Inventors: Hu CHEN, Ye XU, Jianghua WAN