Patents Assigned to Hybix Semiconductor, Inc.
  • Patent number: 7683657
    Abstract: A calibration circuit of an on-die termination device includes a code generating unit configured to receive a voltage of a calibration node and a reference voltage, to generate calibration codes. The calibration unit also includes a calibration resistor unit having parallel resistors which are turned on/off in response to each of the calibration codes and connected to the calibration node, a turn-on strength of at least one of the parallel resistors being controlled by a control signal.
    Type: Grant
    Filed: April 8, 2008
    Date of Patent: March 23, 2010
    Assignee: Hybix Semiconductor, Inc.
    Inventor: Ki-Ho Kim