Patents Assigned to Hynis Semiconductor Inc.
  • Patent number: 7834664
    Abstract: A semiconductor, which includes a first phase detecting unit configured to detect a phase of a second clock on the basis of a phase of a first clock, and generate a first detection signal corresponding to a result of the detection, a second phase detecting unit configured to detect a phase of a delayed clock, which is generated by delaying the second clock by a predetermined time, on the basis of the phase of the first clock, and generate a second detection signal corresponding to a result of the detection, and a logic level determining unit configured to determine a logic level of a feedback output signal according to the first detection signal, the second detection signal and the feedback output signal.
    Type: Grant
    Filed: December 3, 2008
    Date of Patent: November 16, 2010
    Assignee: Hynis Semiconductor Inc.
    Inventors: Sang-Sic Yoon, Kyung-Hoon Kim