Abstract: Disclosed herein is an internal voltage supply circuit for a semiconductor device. The internal voltage supply circuit includes a first voltage driver for supplying a first voltage in response to a first enable signal, a second voltage driver for supplying a second voltage in response to a second enable signal, and a first enable signal generator for generating the first enable signal having an enable period of a desired time according to a current drive capability of the semiconductor device. The enable period is set to be shorter than a predetermined reference period when the current drive capability of the semiconductor device is higher than a predetermined reference current drive capability, and the enable period is set to be longer than the reference period when the current drive capability of the semiconductor device is lower than the reference current drive capability.