Patents Assigned to Hypervision
  • Image emission microscope with improved image processing capability
    Patent number: 4811090
    Abstract: An emission microscope includes integrating and enhancing devices operating in parallel for optimizing the image of a scanned semiconductor device. Integration is terminated when sufficient clarity is acquired. The system further incorporates adaptive histogram matching using a noise distribution curve. Those pixels not meeting a predetermined intensity level are deleted to further enhance image display.
    Type: Grant
    Filed: January 4, 1988
    Date of Patent: March 7, 1989
    Assignee: Hypervision
    Inventor: Neeraj Khurana