Abstract: For example, a Head Mounted Display (HMD) may include a central display configured to display a first image in a central Field of View (FoV) based on an image scene to be displayed to a pupil of a user; a central lens configured to direct light of the first image toward the pupil of the user, a peripheral display configured to display a second image in a temporal FoV based on the image scene; and a peripheral lens configured to direct light of the second image toward the pupil of the user, the peripheral lens is tilted at a tilt angle relative to the central lens.

Abstract: An earpiece-oriented sterilizing dustproof device includes an earpiece rack body, two swing door bodies, a casing, and a sterilization light source module. The earpiece rack body comprises an upper base, a lower base, and a connection element. The connection element is disposed between the upper base and the lower base. The upper base, the lower base and the connection element define a receiving space. The swing door bodies are pivotally connected to two ends of the earpiece rack body, respectively. The swing door bodies conceal the receiving space. The casing is disposed on the lower base and has two opposing transparent oblique surfaces corresponding in position to the swing door bodies, respectively. The sterilization light source module is disposed at the lower base and inside the casing. Therefore, the earpiece-oriented sterilizing dustproof device is dustproof and disinfects ear pads of on-ear earpieces.

Abstract: Disclosed is a method for customizable schema-guided conversion of plain-text documents, rich-text documents and textual data records to an XML-compatible structured form. The method makes substantial use of element content model definitions from a chosen target XML schema/DTD to optimize, closely guide, and disambiguate element pattern matching and recognition. Highly granular structure can be inferred, in best possible conformance with the schema. One embodiment operates based on a finite state machine derived via recursive aggregation of the schema element content models. Additionally disclosed is a method for automated document structuring within the environment of an XML-enabled wordprocessor application. The method entails using the host's API to perform element pattern search and matching and to apply markup to the document in accordance with the inferred XML structure.

Abstract: A light emission microscope includes a low temperature detector array which receives light through a room temperature projection optics system from a device under test. A cold aperture including a movable cold stop and a cryogenic filter absorbs unwanted thermal radiation emitted by the optics system. In one embodiment, a high resolution CCD camera can be used with the low temperature detector array and camera with a computer-controlled mirror providing emitted light to both cameras.

Abstract: Vibration damping apparatus for vibrating environment such as a light emission microscope and an integrated circuit test head includes a rigid member with remotely controlled clamping apparatus attached to spaced portions of the member. The clamping apparatus engage the microscope and the test head for reducing vibrations, and the clamping apparatus can be readily deactivated for moving the microscope or the test head for alignment purposes. Advantageously, two or more rigid members including pneumatic cylinders can be positioned around the device under test while permitting the use of mechanical probes for engaging nodes of an integrated circuit for test purposes.

Abstract: A light emission microscope includes a low temperature detector array which receives light through a room temperature projection optics system from a device under test. A cold aperture including a movable cold stop and a cryogenic filter absorbs unwanted thermal radiation emitted by the optics system. In one embodiment, a high resolution CCD camera can be used with the low temperature detector array and camera with a computer-controlled mirror providing emitted light to both cameras.

Abstract: A system for determining the position, orientation and deformation in 3 dimensional space of a moving object in real-time is provided having a plurality of activatable markers which are mounted onto the object and a sensor section comprising a plurality of individual sensors as shown diagrammatically in FIG. 1. Individual markers are activated in sequence with only one marker energized at any time. Energy emitted by each activated marker is detected by the plurality of sensors positioned remotely. Since only one marker is activated at any time individual determination of the position of the particular energized marker is simplified. Individual sensors are arranged such that each sensor receives a different energy level from an energized marker depending on the relative position of the marker to the sensor. A control unit analyzes the energy distribution range to determine the actual marker position. The system compensates for ambient energy and sensor saturation.

Abstract: Emission microscopy testing of semiconductor integrated circuits is accomplished from the back side of a packaged die or a wafer but selectively milling the back surface using high speed (e.g., 40,000-60,000 rpm) milling tool having a 150 grit 0.125 inch diameter laterally translated at 3 inches per minute and taking cuts up to approximately 0.00025 inch (6 microns). In milling a packaged die, a trench is first milled in the molding material holding the die in the package and surrounding the die so that the tool can momentarily pause to switch directions off the die face. The die or wafer can be thinned to less than 200 microns for the emission microscopy testing.

Abstract: An emission microscope is mounted on a transportable structure for use on a test floor and encloses or garages an entire automatic test equipment head to facilitate high-speed testing. Test procedures allow development of static/fixed defects over time. A video mask can be developed based on emission sites on known good devices so that only emission from defect sites of bad devices under test are shown.

Abstract: An emission microscope includes integrating and enhancing devices operating in parallel for optimizing the image of a scanned semiconductor device. Integration is terminated when sufficient clarity is acquired. The system further incorporates adaptive histogram matching using a noise distribution curve. Those pixels not meeting a predetermined intensity level are deleted to further enhance image display.