Abstract: An injector driver and an operating method thereof are provided in which a driving semiconductor directly controls a brake signal when a brake error occurs in driving an injector, to thus secure a safety function. The injector driver a driving semiconductor configured to transmit an interrupt signal for acknowledging whether a brake signal has been received to a micro-control unit (MCU) when a brake signal is applied. In addition, the driving semiconductor receives a brake signal recognition acknowledgement response signal from the MCU and detects whether the MCU has an error based on the brake signal recognition acknowledgement response signal reception result. Further, the driving semiconductor operates an injector driving signal when the response signal is not received from the MCU for a predetermined period of time.

Abstract: A technique for correcting injector characteristics is provided. In particular, a micro control unit is configured to generate a control pulse for controlling the operation of an injector; and a driving semiconductor is configured to detect and calculate a driving characteristic of the injector and compensating for injection timing of the control pulse in accordance with a deviation in injection timing of the injector.

Abstract: An injector driver and a method of controlling the injector driver are provided. A defect of a driving channel is detected by enabling an identification of safety inspection for each channel in a driving semiconductor during an idle mode. The injector driver includes a plurality of driving switches that operate an injector and a driving semiconductor that drives of the driving switches. In addition, the driving semiconductor determines a short defect of the injector during an idle mode and detects and stores the defective short in a channel unit.

Abstract: A serial communication test device, a system including the same, and a method thereof are provided, which relate to a technology that allows a master chip and a slave ship for Serial Peripheral Interface (SPI) communication to double-check data to increase reliability. The serial communication test device includes an interface that is configured to transmit and receive data to and from an external chip. A controller is configured to store data to be error-checked in a register to output the stored data to the external chip through the interface and to store data received from the external chip through the interface in a data storage unit. The controller compares the data stored in the register with the data stored in the data storage unit and determines whether the data stored in the register is substantially similar to data to be error-checked.

Abstract: An apparatus and method for monitoring multiple micro-cores enable one watchdog to monitor a plurality of micro-cores. The multiple micro-core monitoring apparatus includes: a plurality of micro-cores that periodically output clear signals having different pulse waves; and a watchdog that respectively receives the clear signals having different pulse waves so as to determine presence or absence of an error in the micro-cores, and reset an erroneous micro-core.

Abstract: An injector driver and a method of controlling the injector driver are provided. A defect of a driving channel is detected by enabling an identification of safety inspection for each channel in a driving semiconductor during an idle mode. The injector driver includes a plurality of driving switches that operate an injector and a driving semiconductor that drives of the driving switches. In addition, the driving semiconductor determines a short defect of the injector during an idle mode and detects and stores the defective short in a channel unit.

Abstract: An apparatus and method for monitoring multiple micro-cores enable one watchdog to monitor a plurality of micro-cores. The multiple micro-core monitoring apparatus includes: a plurality of micro-cores that periodically output clear signals having different pulse waves; and a watchdog that respectively receives the clear signals having different pulse waves so as to determine presence or absence of an error in the micro-cores, and reset an erroneous micro-core.

Abstract: A serial communication test device, a system including the same, and a method thereof are provided, which relate to a technology that allows a master chip and a slave ship for Serial Peripheral Interface (SPI) communication to double-check data to increase reliability. The serial communication test device includes an interface that is configured to transmit and receive data to and from an external chip. A controller is configured to store data to be error-checked in a register to output the stored data to the external chip through the interface and to store data received from the external chip through the interface in a data storage unit. The controller compares the data stored in the register with the data stored in the data storage unit and determines whether the data stored in the register is substantially similar to data to be error-checked.

Abstract: An injector driver and an operating method thereof are provided in which a driving semiconductor directly controls a brake signal when a brake error occurs in driving an injector, to thus secure a safety function. The injector driver a driving semiconductor configured to transmit an interrupt signal for acknowledging whether a brake signal has been received to a micro-control unit (MCU) when a brake signal is applied. In addition, the driving semiconductor receives a brake signal recognition acknowledgement response signal from the MCU and detects whether the MCU has an error based on the brake signal recognition acknowledgement response signal reception result Further, the driving semiconductor operates an injector driving signal when the response signal is not received from the MCU for a predetermined period of time.

Abstract: A technique for correcting injector characteristics is provided. In particular, a micro control unit is configured to generate a control pulse for controlling the operation of an injector; and a driving semiconductor is configured to detect and calculate a driving characteristic of the injector and compensating for injection timing of the control pulse in accordance with a deviation in injection timing of the injector.