Patents Assigned to I-MC
  • Patent number: 12157197
    Abstract: A system to control a workpiece during its manufacturing in a machining system. The control being performed in the same manufacturing phase following machining operation. The workpiece being set in the work volume of the machining system. The check operation includes the acquisition of points on the surface of the part. The robot is moved by a cart so the robot can reach the protected working area. The measuring device is positioned relative to the workpiece by the robot. Acquisition of a plurality of points on the surface of the workpiece is performed. The position of the plurality points acquired is compared with the three-dimensional model stored in the memory of the computer.
    Type: Grant
    Filed: May 4, 2020
    Date of Patent: December 3, 2024
    Assignee: I-MC
    Inventors: Dominique Nozais, Zilong Shao, Jean-Yves Hascoet
  • Patent number: 11920917
    Abstract: The invention relates to a method for inspecting a part mounted in a manufacturing fixture between two manufacturing operations by means comprising: a sensor a robot to hold and move the sensor a computer comprising memory means, computation means and display means, comprising in its memory means a three-dimensional digital model of the workpiece, and able to record the coordinates of the points acquired by the sensor the method comprising the steps consisting of: segmenting (1010) of the CAD model into a set of surfaces, designated as nodes, each node corresponding to a surface that is visible in a single acquisition according to the characteristics of the sensor determining (1020) the visibility of each node from each position of the sensor relative to said node determining common visibilities (1030) between the nodes.
    Type: Grant
    Filed: May 19, 2021
    Date of Patent: March 5, 2024
    Assignee: I-MC
    Inventors: Dominique Nozais, Manon Peuzin Jubert, Jean-Luc Mari, Jean-Philippe Pernot, Arnaud Polette