Abstract: An x-ray apparatus comprises an x-ray source and an x-ray detector and there between a member that is configured to perturb x-ray photons incident thereon. The apparatus further comprises a first database of values representative of material type and material thicknesses, a second database of scatter radiation values indicative of material type and/or material thicknesses, a processor configured to perform an algorithm which compares the output signal of the x-ray detector with values in the first database and to output a most likely material and/or thickness from the first database; selects from the second database the scatter radiation associated with the material type and/or material thickness; and removes the scatter radiation from an output signal of the x-ray detector.

Abstract: An x-ray X-ray imaging apparatus includes an x-ray detector (3) that is configured to convert incident x-ray wavelength photons directly into electronic signals, a position for a material under test (2), an x-ray source (1), and a structure (4) configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source (1) is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure (4) configured to perturb the x-ray energy spectrum, and positioned material under test (2). The structure (4) lies between the x-ray source (1) and the member to one side of the position for material under test (2) intersecting the common axis, and the structure (4) includes at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.

Abstract: An x-ray detector apparatus includes at least one x-ray detector (3) having a position for a material under test (2), an x-ray source (1), and a plurality of structures (4) each configured to perturb an x-ray energy spectrum differently. The structures (4) may be placed in the path of the x-ray energy spectrum sequentially or concurrently. A plurality of x-ray detectors (3) may be formed into a linear array.

Abstract: An x-ray/gamma ray imaging apparatus includes a pixilated x-ray/gamma ray detector (3) including a member configured to detect incident x-ray/gamma ray wavelength photons, a position for a body under test (2), an x-ray or gamma ray source (1), and a structure configured to perturb the energy spectrum (6), each lying on a common axis. The source is arranged to direct an x-ray gamma ray energy spectrum along the common axis to impinge upon a structure configured to perturb the x-ray energy spectrum and a positioned body/object under test. The structure and the position for the body under test lie between the source and the detector member, and the structure includes at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently. Detected photons are subject to a random noise reduction algorithm.

Abstract: An X-ray imaging apparatus is disclosed that includes an x-ray detector. The x-ray detector includes a member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons, a position for a material under test, an x-ray source, and a structure configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and positioned material under test. The structure lies between the x-ray source and the member to one side of the position for material under test intersecting the common axis, and the structure includes at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.

Abstract: An x-ray apparatus comprises an x-ray source and an x-ray detector and there between a member that is configured to perturb x-ray photons incident thereon. The apparatus further comprises a first database of values representative of material type and material thicknesses, a second database of scatter radiation values indicative of material type and/or material thicknesses, a processor configured to perform an algorithm which compares the output signal of the x-ray detector with values in the first database and to output a most likely material and/or thickness from the first database; selects from the second database the scatter radiation associated with the material type and/or material thickness; and removes the scatter radiation from an output signal of the x-ray detector.

Abstract: An X-ray imaging apparatus is disclosed that includes an x-ray detector. The x-ray detector includes a member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons, a position for a material under test, an x-ray source, and a structure configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and positioned material under test. The structure lies between the x-ray source and the member to one side of the position for material under test intersecting the common axis, and the structure includes at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.

Abstract: X-ray imaging apparatus, which includes an x-ray detector. The x-ray detector comprises a member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons, a position for a material under test, an x-ray source, and a structure configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and positioned material under test. The structure lies between the x-ray source and the member to one side of the position for material under test intersecting the common axis, and the said structure comprises at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.

Abstract: An x-ray/gamma ray imaging apparatus includes a pixilated x-ray/gamma ray detector (3) including a member configured to detect incident x-ray/gamma ray wavelength photons, a position for a body under test (2), an x-ray or gamma ray source (1), and a structure configured to perturb the energy spectrum (6), each lying on a common axis. The source is arranged to direct an x-ray gamma ray energy spectrum along the common axis to impinge upon a structure configured to perturb the x-ray energy spectrum and a positioned body/object under test. The structure and the position for the body under test lie between the source and the detector member, and the structure includes at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently. Detected photons are subject to a random noise reduction algorithm.

Abstract: An x-ray detector apparatus includes at least one x-ray detector (3) having a position for a material under test (2), an x-ray source (1), and a plurality of structures (4) each configured to perturb an x-ray energy spectrum differently. The structures (4) may be placed in the path of the x-ray energy spectrum sequentially or concurrently. A plurality of x-ray detectors (3) may be formed into a linear array.

Abstract: An x-ray X-ray imaging apparatus includes an x-ray detector (3) that is configured to convert incident x-ray wavelength photons directly into electronic signals, a position for a material under test (2), an x-ray source (1), and a structure (4) configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source (1) is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure (4) configured to perturb the x-ray energy spectrum, and positioned material under test (2). The structure (4) lies between the x-ray source (1) and the member to one side of the position for material under test (2) intersecting the common axis, and the structure (4) includes at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.

Abstract: X-ray imaging apparatus,which includes an x-ray detector. The x-ray detector comprises a member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons, a position for a material under test, an x-ray source, and a structure configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and positioned material under test. The structure lies between the x-ray source and the member to one side of the position for material under test intersecting the common axis, and the said structure comprises at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.