Patents Assigned to IC ANALYTICA, LLC
  • Apparatus and method for testing all test circuits on a wafer from a single test site
    Patent number: 12153087
    Abstract: An apparatus has a semiconductor wafer hosting rows and columns of chips, where the rows and columns of chips are separated by scribe lines. Vertical and horizontal routing lines are in the scribe lines interconnecting the rows and columns of chips. Test circuit sites are in the scribe lines, each test circuit site including contact pads for simultaneous connection to probe card needles, sensor circuit select and control circuitry, and a sensor circuit bank.
    Type: Grant
    Filed: June 24, 2022
    Date of Patent: November 26, 2024
    Assignee: IC ANALYTICA, LLC
    Inventors: Patrick G. Drennan, Joseph S. Spector, Richard Wunderlich
  • Apparatus and method for managing power of test circuits
    Patent number: 12007429
    Abstract: An apparatus has a semiconductor wafer hosting rows and columns of chips, where the rows and columns of chips are separated by scribe lines. Voltage regulators are positioned within the scribe lines. Each voltage regulator is connected to one or more chips. Selection circuitry is positioned within the scribe lines. The selection circuitry governs access to a chip being tested.
    Type: Grant
    Filed: June 24, 2022
    Date of Patent: June 11, 2024
    Assignee: IC ANALYTICA, LLC
    Inventors: Patrick G. Drennan, Joseph S. Spector, Richard Wunderlich