Patents Assigned to ICOS Vision Systems NV
  • SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT
    Publication number: 20110149298
    Abstract: A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.
    Type: Application
    Filed: September 3, 2009
    Publication date: June 23, 2011
    Applicant: ICOS Vision Systems NV
    Inventors: Yoel Arieli, Shay Wolfling, David Banitt, Yosi Weitzman, Yoram Saban, Emmanuel Lanzmann, Shay Levavi
  • Spatial wavefront analysis and 3D measurement
    Patent number: 7609388
    Abstract: A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.
    Type: Grant
    Filed: October 16, 2002
    Date of Patent: October 27, 2009
    Assignee: ICOS Vision Systems NV
    Inventors: Yoel Arieli, Shay Wolfling, David Banitt, Yosi Weitzman, Yoram Saban, Emmanuel Lanzmann, Shay Levavi
  • System for inspecting the surfaces of objects
    Patent number: 6970238
    Abstract: An inspection system optically examines the surfaces of objects to detect surface errors. The system scans image strips and, consequently, a given surface rapidly and with sufficient resolution using a linescan camera and an upstream microscope by aligning the captured lines.
    Type: Grant
    Filed: April 12, 2001
    Date of Patent: November 29, 2005
    Assignee: ICOS Vision Systems NV
    Inventors: Detlef Gerhard, Johannes Lechner