Patents Assigned to ICTK Holdings Co., Ltd.
  • Patent number: 10771268
    Abstract: Provided is an apparatus for generating digital values to provide a random digital value. The apparatus may generate the digital value based on a semiconductor process variation. The apparatus may include a generating unit to generate a plurality of digital values, based on the semiconductor process variation, and a processing unit to process the digital values and to provide a first digital value. The generating unit may include a plurality of physically unclonable functions (PUFs). A parameter may be differently applied to the PUFs, and the PUFs may generate the digital values.
    Type: Grant
    Filed: October 3, 2018
    Date of Patent: September 8, 2020
    Assignee: ICTK HOLDINGS CO., LTD
    Inventors: Dong Kyue Kim, Byong Deok Choi
  • Patent number: 10769309
    Abstract: Provided is an apparatus for generating an identification key by a probabilistic determination of a short occurring between nodes constituting a circuit, by violating a design rule provided during a semiconductor manufacturing process. The identification key generating apparatus may include an identification key generator to generate an identification key based on whether a contact or a via used to electrically connect conductive layers in a semiconductor chip shorts the conductive layers, and an identification key reader to read the identification key by reading whether the contact or the via shorts the conductive layers.
    Type: Grant
    Filed: February 4, 2019
    Date of Patent: September 8, 2020
    Assignee: ICTK HOLDINGS CO., LTD
    Inventors: Byong Deok Choi, Dong Kyue Kim, Tae Wook Kim
  • Patent number: 10659232
    Abstract: Disclosed is an authentication apparatus using a public key encryption algorithm. An apparatus according to an embodiment generates a first instant public key through a random number generation process in response to an electronic signature generation request corresponding to a message. Further, the apparatus calculates and uses a first instant private key making a pair with the first instant public key, using the first instant public key.
    Type: Grant
    Filed: April 9, 2015
    Date of Patent: May 19, 2020
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Dong Kyue Kim, Byong Deok Choi, Dong Hyun Kim, Sang Seon Park
  • Patent number: 10658311
    Abstract: Provided is a device for generating an identification key using a process variation during a manufacturing process of a conductive layer. The device for generating an identification key may include a plurality of conductive layers designed so as to be formed in a first region within a semiconductor chip, the density in which the plurality of conductive layers are disposed in the first region being at least a first threshold value and not more than a second threshold value, the first and second threshold values being less than a minimum density according to the design rules for ensuring that all of the plurality of conductive layers are formed in the first region; and a reader which provides an identification key by identifying if, among the plurality of conductive layers, a previously designated first conductive layer has been formed.
    Type: Grant
    Filed: January 17, 2019
    Date of Patent: May 19, 2020
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Patent number: 10629549
    Abstract: Provided are a device and method for generating an identification key using process variation during a bipolar junction transistor (BJT) process. A BJT may be produced by designing such that the effective base width of the BJT is at least a first threshold value but not more than a second threshold value, or, such that the total of the width of a second depletion region formed by connection with a collector region and the width of a first depletion region formed by connection with an emitter region, within a base region, differs from the width of the base region by a value that is at least the first threshold value but not more than the second threshold value. Whether or not there is a short circuit between the emitter region and the collector region is stochastically generated by means of process variation, and if ordinary turn-on voltage is not applied to the base in the produced BJT, whether or not there is a short circuit is identified by means of a reader and an identifier is provided.
    Type: Grant
    Filed: April 19, 2019
    Date of Patent: April 21, 2020
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Patent number: 10629548
    Abstract: Provided are a device and method for generating an identification key using process variation during a bipolar junction transistor (BJT) process. A BJT may be produced by designing such that the effective base width of the BJT is at least a first threshold value but not more than a second threshold value, or, such that the total of the width of a second depletion region formed by connection with a collector region and the width of a first depletion region formed by connection with an emitter region, within a base region, differs from the width of the base region by a value that is at least the first threshold value but not more than the second threshold value. Whether or not there is a short circuit between the emitter region and the collector region is stochastically generated, and if ordinary turn-on voltage is not applied, whether or not there is a short circuit is identified.
    Type: Grant
    Filed: February 7, 2019
    Date of Patent: April 21, 2020
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Patent number: 10423067
    Abstract: Disclosed is a method of generating a physical unclonable function (PUF) by causing unpredictable partial process failure for a semiconductor process. In a designing process, a second mask pattern may be printed by distorting a size and/or shape of at least one mask window included in a designed first mask pattern, without violating semiconductor design rules. A PUF may be generated using a photomask including the printed second mask pattern for photolithography.
    Type: Grant
    Filed: August 26, 2014
    Date of Patent: September 24, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim, Kwang Hyun Jee
  • Publication number: 20190171850
    Abstract: Provided is an apparatus for generating an identification key by a probabilistic determination of a short occurring between nodes constituting a circuit, by violating a design rule provided during a semiconductor manufacturing process. The identification key generating apparatus may include an identification key generator to generate an identification key based on whether a contact or a via used to electrically connect conductive layers in a semiconductor chip shorts the conductive layers, and an identification key reader to read the identification key by reading whether the contact or the via shorts the conductive layers.
    Type: Application
    Filed: February 4, 2019
    Publication date: June 6, 2019
    Applicant: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok CHOI, Dong Kyue KIM, Tae Wook KIM
  • Publication number: 20190114437
    Abstract: A vehicle security network design device may comprise: a level assigning unit for assigning an automobile safety integrity level (ASIL) which provides a risk management standard for each of a plurality of functional elements in a vehicle that is at least temporarily implemented by a processor; a calculation unit for calculating device's controllability with respect to each of the plurality of functional elements on the basis of a connection structure between the plurality of functional elements and a difference value of the ASIL; and a management unit for generating a risk analysis model of a plurality of functional elements.
    Type: Application
    Filed: January 19, 2017
    Publication date: April 18, 2019
    Applicants: IUCF-HYU(Industry-University Cooperation Foundation Hanyang University, ICTK Holdings Co., Ltd.
    Inventors: Dong Kyue KIM, Byong Deok CHOI
  • Patent number: 10263781
    Abstract: An IC chip for preventing an authentication key from leaking, and an authentication key setting and authentication key verifying method are provided. A part performing connection or disconnection between an external terminal and a smartcard chip may be configured by a separate chip or may be incorporated into the smartcard chip to configure a single chip. When the part is configured by the separate chip, the disconnection between the external terminal and the smart card chip can be performed according to whether an authentication key is verified. When the part is configured by the one chip, the disconnection between the external terminal and the smart card chip can be performed under a control of the smartcard chip according to whether the authentication key is verified.
    Type: Grant
    Filed: January 15, 2014
    Date of Patent: April 16, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim, Sang Seon Park, Kwang Hyun Jee, Dong Hyun Kim
  • Patent number: 10235540
    Abstract: Provided is an apparatus for generating an identification key by a probabilistic determination of a short occurring between nodes constituting a circuit, by violating a design rule provided during a semiconductor manufacturing process. The identification key generating apparatus may include an identification key generator to generate an identification key based on whether a contact or a via used to electrically connect conductive layers in a semiconductor chip shorts the conductive layers, and an identification key reader to read the identification key by reading whether the contact or the via shorts the conductive layers.
    Type: Grant
    Filed: February 4, 2016
    Date of Patent: March 19, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim, Tae Wook Kim
  • Patent number: 10235261
    Abstract: A randomness testing apparatus is disclosed. A randomness testing apparatus according to an embodiment includes a randomness testing module to conduct a randomness test on physically unclonable function (PUF)-based hardware and a processing device to determine whether the PUF-based hardware is defective on the basis of a randomness test result.
    Type: Grant
    Filed: July 28, 2014
    Date of Patent: March 19, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Dong Kyue Kim, Byong Deok Choi, Kwang Hyun Jee
  • Patent number: 10224296
    Abstract: Provided is a device for generating an identification key using a process variation during a manufacturing process of a conductive layer. The device for generating an identification key may include a plurality of conductive layers designed so as to be formed in a first region within a semiconductor chip, the density in which the plurality of conductive layers are disposed in the first region being at least a first threshold value and not more than a second threshold value, the first and second threshold values being less than a minimum density according to the design rules for ensuring that all of the plurality of conductive layers are formed in the first region; and a reader which provides an identification key by identifying if, among the plurality of conductive layers, a previously designated first conductive layer has been formed.
    Type: Grant
    Filed: February 17, 2014
    Date of Patent: March 5, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Patent number: 10224295
    Abstract: Provided are a device and method for generating an identification key using process variation during a bipolar junction transistor (BJT) process. A BJT may be produced by designing such that the effective base width of the BJT is at least a first threshold value but not more than a second threshold value, or, such that the total of the width of a second depletion region formed by connection with a collector region and the width of a first depletion region formed by connection with an emitter region, within a base region, differs from the width of the base region by a value that is at least the first threshold value but not more than the second threshold value. Whether or not there is a short circuit between the emitter region and the collector region is stochastically generated, and if ordinary turn-on voltage is not applied, whether or not there is a short circuit is identified.
    Type: Grant
    Filed: February 17, 2014
    Date of Patent: March 5, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Publication number: 20190036714
    Abstract: Provided is an apparatus for generating digital values to provide a random digital value. The apparatus may generate the digital value based on a semiconductor process variation. The apparatus may include a generating unit to generate a plurality of digital values, based on the semiconductor process variation, and a processing unit to process the digital values and to provide a first digital value. The generating unit may include a plurality of physically unclonable functions (PUFs). A parameter may be differently applied to the PUFs, and the PUFs may generate the digital values.
    Type: Application
    Filed: October 3, 2018
    Publication date: January 31, 2019
    Applicant: ICTK Holdings Co., Ltd.
    Inventors: Dong Kyue KIM, Byong Deok CHOI
  • Patent number: 10193701
    Abstract: Provided is an information processing apparatus including a physical unclonable function (PUF) to generate a unique key using a process variation in a semiconductor manufacturing process, and an encryption unit to encrypt a password and/or bio-information received from a user using the unique key.
    Type: Grant
    Filed: June 27, 2017
    Date of Patent: January 29, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Dong Kyue Kim, Byong Deok Choi, Dong Hyun Kim, Kwang Hyun Jee
  • Patent number: 10134691
    Abstract: An apparatus for generating an identification key is provided. The apparatus may include a first conductive layer formed on a semiconductor chip, a second conductive layer formed on the semiconductor chip, wherein a spacing between the first conductive layer and the second conductive layer is equal to or greater than a first threshold and equal to or less than a second threshold, and a reader configured to determine whether a first node associated with the first conductive layer and a second node associated with the second conductive layer are shorted, and to provide an identification key.
    Type: Grant
    Filed: February 17, 2014
    Date of Patent: November 20, 2018
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Patent number: 10122537
    Abstract: Provided is an apparatus for generating digital values to provide a random digital value. The apparatus may generate the digital value based on a semiconductor process variation. The apparatus may include a generating unit to generate a plurality of digital values, based on the semiconductor process variation, and a processing unit to process the digital values and to provide a first digital value. The generating unit may include a plurality of physically unclonable functions (PUFs). A parameter may be differently applied to the PUFs, and the PUFs may generate the digital values.
    Type: Grant
    Filed: December 30, 2014
    Date of Patent: November 6, 2018
    Assignee: ICTK HOLDINGS CO., LTD.
    Inventors: Dong Kyue Kim, Byong Deok Choi
  • Patent number: 10033814
    Abstract: A security system capable of preventing a security attack/threat on a vehicle network is provided. At least one security zone is set by using a risk level which is evaluated for a plurality of vehicle functional elements. In addition, a security countermeasure corresponding to the risk level of the security zone can be provided to a conduit of the security zone so as to perform gate keeping.
    Type: Grant
    Filed: October 8, 2014
    Date of Patent: July 24, 2018
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Dong Kyue Kim, Byong Deok Choi, Kwang Hyun Jee
  • Patent number: 10032729
    Abstract: Provided is an apparatus for generating an identification key by using process variation in a conductive layer manufacturing process. The apparatus may include a first contact connected to a first conductive layer included in a semiconductor chip, wherein a first node is formed by an electrical connection between the first conductive layer and the first contact, a second contact connected to a second conductive layer included in the semiconductor chip, wherein a second node is formed by an electrical connection between the second conductive layer and the second contact, and wherein a value of a spacing between the first contact and the second contact is smaller than a minimum spacing value that guarantees that the first node and the second node are not shorted on a patterning layout, and a reader configured to determine whether the first node and the second node are electrically shorted and to provide the identification key.
    Type: Grant
    Filed: February 17, 2014
    Date of Patent: July 24, 2018
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim