Patents Assigned to IDx, LLC
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Patent number: 10115194Abstract: Provided is a method for training a neural network to detect features in a retinal image. The method may include the steps of: combining and randomizing feature images into a Training data set; combining and randomizing the feature images into a testing dataset; training a plurality of neural networks having different architectures using a subset of the training dataset while testing on a subset of the testing dataset; identifying the best neural network based on each of the plurality of neural networks performance on the testing data set; inputting images to the best neural network and identifying a limited number of false positives and false negative and adding the false positives and false negatives to the training dataset and testing dataset; and repeating the foregoing steps until an objective performance threshold is reached.Type: GrantFiled: April 6, 2016Date of Patent: October 30, 2018Assignee: IDx, LLCInventors: Meindert Niemeijer, Ryan Amelon, Warrent Claride, Michael D. Abramoff
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Patent number: 9814386Abstract: An ocular alignment system for aligning a subject's eye with an optical axis of an ocular imaging device comprising one or more guide light and one or more baffle configured to mask the one or more guide light from view of the subject such that the one or more guide light is only visible to the subject when the eye of the subject is aligned with the optical axis of an ocular imaging system.Type: GrantFiled: July 2, 2015Date of Patent: November 14, 2017Assignee: IDx, LLCInventors: Michael Abramoff, Eric Talmage, Ben Clark, Edward DeHoog, Timothy Chung
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Patent number: 9782065Abstract: Provided is a snapshot spectral domain optical coherence tomographer comprising a light source providing a plurality of beamlets; a beam splitter, splitting the plurality of beamlets into a reference arm and a sample arm; a first optical system that projects the sample arm onto multiple locations of a sample; a second optical system for collection of a plurality of reflected sample beamlets; a third optical system projecting the reference arm to a reflecting surface and receiving a plurality of reflected reference beamlets; a parallel interferometer that provides a plurality of interferograms from each of the plurality of sample beamlets with each of the plurality of reference beamlets; an optical image mapper configured to spatially separate the plurality of interferograms; a spectrometer configured to disperse each of the interferograms into its respective spectral components and project each interferogram in parallel; and a photodetector providing photon quantification.Type: GrantFiled: September 28, 2015Date of Patent: October 10, 2017Assignee: IDX, LLCInventors: Michael D. Abramoff, Edward DeHoog
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Patent number: 9155465Abstract: Provided is a snapshot spectral domain optical coherence tomographer comprising: a light source providing a plurality of beamlets; a beam splitter, splitting the plurality of beamlets into a reference arm and a sample arm; a first optical system that projects the sample arm onto multiple locations of a sample; a second optical system for collection of a plurality of reflected sample beamlets; a third optical system projecting the reference arm to a reflecting surface and receiving a plurality of reflected reference beamlets; a parallel interferometer that provides a plurality of interferograms from each of the plurality of sample beamlets with each of the plurality of reference beamlets; an optical image mapper configured to spatially separate the plurality of interferograms; a spectrometer configured to disperse each of the interferograms into its respective spectral components and project each interferogram in parallel; and a photodetector providing photon quantification.Type: GrantFiled: April 30, 2014Date of Patent: October 13, 2015Assignee: IDX, LLCInventors: Michael D. Abramoff, Edward DeHoog
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Publication number: 20140320816Abstract: Provided is a snapshot spectral domain optical coherence tomographer comprising: a light source providing a plurality of beamlets; a beam splitter, splitting the plurality of beamlets into a reference arm and a sample arm; a first optical system that projects the sample arm onto multiple locations of a sample; a second optical system for collection of a plurality of reflected sample beamlets; a third optical system projecting the reference arm to a reflecting surface and receiving a plurality of reflected reference beamlets; a parallel interferometer that provides a plurality of interferograms from each of the plurality of sample beamlets with each of the plurality of reference beamlets; an optical image mapper configured to spatially separate the plurality of interferograms; a spectrometer configured to disperse each of the interferograms into its respective spectral components and project each interferogram in parallel; and a photodetector providing photon quantification.Type: ApplicationFiled: April 30, 2014Publication date: October 30, 2014Applicant: IDx, LLCInventors: Michael D. Abramoff, Edward DeHoog