Patents Assigned to IEC Infrared Systems LLC
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Patent number: 10367996Abstract: Example apparatus and methods produce image correction data for a lens or sensor based on individual images acquired under different operating parameters. Example apparatus and methods then produce strip correction data based on a strip of images pieced together from the individual images. Example apparatus and methods then produce panoramic image correction data based on a panoramic image pieced together from two or more strips of images. The strip of images is produced without using a hemispherical mirror and thus accounts more accurately for issues associated with making a two dimensional representation of a three dimensional spherical volume. Images are acquired using different imaging parameters (e.g., focal length, pan position, tilt position) under different imaging conditions (e.g., temperature, humidity, atmospheric pressure, pan rate, tilt rate) to account for aberrations that may appear or be exacerbated under operating conditions.Type: GrantFiled: December 5, 2017Date of Patent: July 30, 2019Assignee: IEC Infrared Systems, LLCInventors: Richard Pettegrew, John Paximadis
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Patent number: 10084960Abstract: Example apparatus and methods acquire individual frames of a portion of a scene under a variety of different operating parameters. Example apparatus and methods then piece together strips of frames from the individual frames. Example apparatus and methods then produce a panoramic image from the strips of frames. Frames are acquired using different imaging parameters (e.g., focal length, pan position, tilt position) under different imaging conditions (e.g., temperature, humidity, atmospheric pressure, pan rate, tilt rate). The frames may be acquired by cameras located in a panoramic view image system and in a drone. The drone may provide imagery or data. The imagery or data may be used to update or enhance the panoramic image by, for example, displaying imagery of a blind spot in the panoramic image. In different embodiments, drones may be detected or controlled.Type: GrantFiled: September 25, 2015Date of Patent: September 25, 2018Assignee: IEC Infrared Systems, LLCInventors: Richard Pettegrew, John Paximadis
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Patent number: 10033924Abstract: Example apparatus and methods acquire individual images under a variety of different operating parameters. Example apparatus and methods then piece together strips of images from the individual images. Example apparatus and methods then produce a panoramic image from the strips of images. A strip of frames is produced without using a hemispherical mirror and thus accounts more accurately for issues associated with making a two dimensional representation of a three dimensional spherical volume. Images are acquired using different imaging parameters (e.g., focal length, pan position, tilt position) under different imaging conditions (e.g., temperature, humidity, atmospheric pressure, pan rate, tilt rate). Example apparatus and methods correct images using correction data that is related to the operating parameters.Type: GrantFiled: September 25, 2015Date of Patent: July 24, 2018Assignee: IEC Infrared Systems, LLCInventors: Richard Pettegrew, John Paximadis
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Patent number: 9876954Abstract: Example apparatus and methods produce image correction data for a lens or sensor based on individual images acquired under different operating parameters. Example apparatus and methods then produce strip correction data based on a strip of images pieced together from the individual images. Example apparatus and methods then produce panoramic image correction data based on a panoramic image pieced together from two or more strips of images. The strip of images is produced without using a hemispherical mirror and thus accounts more accurately for issues associated with making a two dimensional representation of a three dimensional spherical volume. Images are acquired using different imaging parameters (e.g., focal length, pan position, tilt position) under different imaging conditions (e.g., temperature, humidity, atmospheric pressure, pan rate, tilt rate) to account for aberrations that may appear or be exacerbated under operating conditions.Type: GrantFiled: September 25, 2015Date of Patent: January 23, 2018Assignee: IEC Infrared Systems, LLCInventors: Richard Pettegrew, John Paximadis
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Patent number: 9420177Abstract: Example systems and methods acquire individual frames under a variety of different operating parameters. Example systems and methods then piece together strips of frames from the individual frames. Example systems and methods then produce a panoramic image from the strips of frames. Frames are acquired using different imaging parameters (e.g., focal length, pan position, tilt position) under different imaging conditions (e.g., temperature, humidity, atmospheric pressure, pan rate, tilt rate). Range information is acquired and associated with different locations (e.g., pixels) in frames. Range information may be acquired for some locations and estimated for other locations. Blind spots in a scene may be identified. Range information may then be retrieved quickly from the panoramic image or from a data structure associated with the panoramic image without having to find the range again.Type: GrantFiled: September 25, 2015Date of Patent: August 16, 2016Assignee: IEC Infrared Systems LLCInventors: Richard Pettegrew, John Paximadis