Abstract: Apparatus and a method for the detection and identification of light diverting and transparent defects with optical properties in a transparent medium. The apparatus has a light source with an aperture stop, a lens system focusing an image of the aperture stop at a plane, and means to pass the transparent medium through said column of light. The apparatus and method provide dark view images of the defects. The apparatus and method may be combined with a viewing area inspection system. The transparent medium may be curved, and especially face plates for cathode ray tubes.

Abstract: A method of inspecting a bottle (14) having a threaded section (104) for thread defects as the bottle moves along a production line (10) requires video images (100) of the bottle to be taken as the bottle moves into the fields of view of video cameras (22). Each video image encompasses a general region of interest (108) which contains at least a portion of the threaded section of the bottle. The position of the bottle (14) within the video image is then determined based on the location of the top rim (110) of the bottle within the video image. A portion of the general region of interest which encompasses at least a portion of the threaded section of the bottle is segmented into a plurality of specific regions of interest (120, 122). Pixels of the video image within the specific regions of interest are then examined to detect thread defects.

Abstract: Apparatus and methods for system and method for testing and aligning a CRT which can sequentially perform all of the tests needed to precisely align the CRT and provide real-time feedback for operator adjustments. The system can integrate each of the measurements and automatically verify measurements previously performed as required. An improved color CCD camera is also provided which can maintain focus irrespective of variations in the thickness and glass curvature of the CRT screen. Further, photodiode optical filter and lens assemblies and wobulator assemblies can be incorporated into the system to further improve the testing and aligning of the CRTs.

Abstract: A method of calculating beam landing errors in an electronic display device having color phosphor elements and electron guns to generate electron beams to impinge on corresponding phosphor elements require a magnetic field to be generated to deflect an electron beam relative to the corresponding phosphor element on which the electron beam is to impinge. The intensity of light emitted by the phosphor elements in the measurement area is measured as the electron beam impinges thereon. The polarity of the magnetic field is reversed and the above step is repeated. Thereafter, the magnitude of the magnetic field is changed and the above two steps are repeated thereby to measure at least two different light intensities resulting from electron beam influenced by each polarity magnetic field. The at least two different light intensities resulting from electron beams influenced by each polarity magnetic field are then approximated with straight lines and an intersection point of the straight lines is determined.

Abstract: In a method of measuring electron beam profile in an electronic display device, a matrix of video dots is displayed on a display screen of the electronic display device, each of the video dots being comprised of a group of phosphor dots illuminated by an electron beam. An image of a plurality of groups of illuminated phosphor dots forming the video dots within a field of view is then taken. The average horizontal and vertical distances of the video dots within the filed of view is determined and the groups of illuminated phosphor dots forming the video dots in the field of view that are captured in the image are superimposed based on the average horizontal and vertical distances of the video dots generally to average and fill in discontinuities between phosphor dots in the groups and thereby generate an overlay image of the electron beam. Cross-sections of the overlay image can be approximated and at least one intensity profile of the electron beam calculated.

Abstract: A test and alignment system for an electronic display device comprises a test pattern generator to be connected to an electronic display device for causing images of video test patterns to be displayed by the electronic display device. A test fixture is positioned in front of the electronic display device to be tested and aligned. The test fixture includes a frame supporting a plurality of close-up optical sensors to sense and produce image signals corresponding to small areas of images displayed on the electronic display device and a plurality of wide-angle optical sensors behind the close-up optical sensors for sensing and producing image signals corresponding to large areas of images displayed on the electronic display device. A computer controls the test pattern generator and processes and analyses the image signals generated by the close-up and wide-angle optical sensors to perform a series of tests on the electronic display device.