Patents Assigned to Imaging Systems International
  • X-ray inspection system
    Patent number: 5541856
    Abstract: An x-ray inspection machine particularly suited for use on an assembly line has a narrow footprint produced by mounting opposed x-ray tube and camera on independently movable stages locked together by way of a central computer rather than a physical member. The stages are aligned by using position sensors at home positions and a fiduciary mark on the part to be inspected. The independent motion of the stages permits a limited range of angled inspections to be obtained without additional angulation mechanisms.
    Type: Grant
    Filed: November 8, 1993
    Date of Patent: July 30, 1996
    Assignee: Imaging Systems International
    Inventor: David W. Hammermeister