Patents Assigned to Imago Scientific Instruments Corporation
  • Publication number: 20110260054
    Abstract: The present invention relates to atom probe pulse energy. One aspect of the invention is directed toward a method that includes establishing a data relationship between pulse energy and bias energy for a target evaporation rate. In selected embodiments, establishing a data relationship can include determining an equivalent pulse fraction for a selected pulse energy and bias energy combination based on a local change in bias energy compared to a local change in pulse energy associated with the selected pulse energy and bias energy combination. Another aspect of the invention is directed toward a method that includes determining an equivalent pulse fraction for a first bias energy and pulse energy combination and/or a second bias energy and pulse energy combination based on the difference between the first bias energy and the second bias energy compared to the difference between the first pulse energy and the second pulse energy.
    Type: Application
    Filed: October 31, 2006
    Publication date: October 27, 2011
    Applicant: Imago Scientific Instruments Corporation
    Inventor: Joseph H. Bunton
  • Publication number: 20100204927
    Abstract: The present invention relates to atom probe data processes and associated systems. Aspects of the invention are directed toward a computing system configured to process atom probe data that includes a data set receiving component configured to receive a first three-dimensional data set. The first three-dimensional data set has a first data element structure and is based on data collected from performing an atom probe process on a portion of an atom probe specimen. The system further includes a data set constructing component configured to create a second three-dimensional data set having a second data element structure different than the first data element structure. In selected embodiments, the system can further include a Fourier Transform component configured to perform a Fourier Transform on a portion of the second three-dimensional data set.
    Type: Application
    Filed: April 12, 2007
    Publication date: August 12, 2010
    Applicant: IMAGO SCIENTIFIC INSTRUMENTS CORPORATION
    Inventors: Brian P. Geiser, Thomas F. Kelly, Jason Schneir, Jay P. Roberts, David J. Larson, Scott A. Wiener
  • Publication number: 20100148060
    Abstract: Aspects of the present invention are directed generally toward atom probe and three-dimensional atom probe microscopes. For example, certain aspects of the invention are directed-toward an atom probe or a three-dimensional atom probe that includes a sub-nanosecond laser to evaporate ions from a specimen under analysis and a reflectron for reflecting the ions. In further aspects of the invention, the reflectron can include a front electrode and a back electrode. At least one of the front and back electrodes can be capable of generating a curved electric field. Additionally, the front electrode and back electrodes can be configured to perform time focusing and resolve an image of a specimen.
    Type: Application
    Filed: June 16, 2006
    Publication date: June 17, 2010
    Applicant: Imago Scientific Instruments Corporation
    Inventor: Peter Panayi
  • Publication number: 20100116985
    Abstract: A laser atom probe situates a counter electrode between a specimen mount and a detector, and provides a laser having its beam aligned to illuminate the specimen through the aperture of the counter electrode. The detector, specimen mount, and/or the counter electrode may be charged to some boost voltage and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. Automated alignment methods are described wherein the laser is automatically directed to areas of interest.
    Type: Application
    Filed: January 22, 2010
    Publication date: May 13, 2010
    Applicant: Imago Scientific Instruments Corporation
    Inventors: Joseph H. Bunton, Jesse D. Olson
  • Patent number: 7683318
    Abstract: A laser atom probe (100) situates a counter electrode between a specimen mount and a detector (106), and provides a laser (116) having its beam (122) aligned to illuminate the specimen (104) through the aperture (110) of the counter electrode (108). The detector, specimen mount (102), and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. Automated alignment methods are described wherein the laser is automatically directed to areas of interest.
    Type: Grant
    Filed: August 19, 2004
    Date of Patent: March 23, 2010
    Assignee: Imago Scientific Instruments Corporation
    Inventors: Joseph H. Bunton, Thomas F. Kelly, Tye T. Gribb
  • Patent number: 7652269
    Abstract: A laser atom probe (100) situates a counter electrode between a specimen mount and a detector (106), and provides a laser (116) having its beam (122) aligned to illuminate the specimen (104) through the aperture (110) of the counter electrode (108). The detector, specimen mount (102), and/or the counter electrode may be charged to some boost voltage and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. Automated alignment methods are described wherein the laser is automatically directed to areas of interest.
    Type: Grant
    Filed: August 19, 2004
    Date of Patent: January 26, 2010
    Assignee: Imago Scientific Instruments Corporation
    Inventors: Joseph Hale Bunton, Jesse D. Olson
  • Publication number: 20090114620
    Abstract: A method for treating an atom probe electrode (120), which comprises the steps of providing an atom electrode (120) having a surface (123) and an aperture (122); and removing material (604) from the surface (123) to reduce a potential of the atom probe electrode creating a non-uniformity in an electric field (502) when the atom probe electrode is used in a atom probe device during specimen analysis.
    Type: Application
    Filed: July 21, 2005
    Publication date: May 7, 2009
    Applicant: Imago Scientific Instruments Corporation
    Inventors: Robert M. Ulfig, Joseph H. Bunton, Thomas F. Kelly, David J. Larson, Richard L. Martens, Keith J. Thompson, Scott A. Wiener
  • Publication number: 20090050797
    Abstract: In an atom probe or other mass spectrometer wherein a specimen is subjected to ionizing pulses (voltage pulses, thermal pulses, etc.) which induce field evaporation of ions from the specimen, the evaporated ions are then subjected to corrective pulses which are synchronized with the ionizing pulses. These corrective pulses have a magnitude and timing sufficient to reduce the velocity distribution of the evaporated ions, thereby resulting in increased mass resolution for the atom probe/mass spectrometer. In a preferred arrangement, ionizing pulses are supplied to the specimen from a first counter electrode adjacent the specimen. The corrective pulses are then supplied from a second counter electrode which is coupled to the first via a passive or active network, with the network controlling the form (timing, amplitude, and shape) of the corrective pulses.
    Type: Application
    Filed: June 17, 2005
    Publication date: February 26, 2009
    Applicant: Imago Scientific Instruments Corporation
    Inventors: Tye Gribb, Jesse D. Olson, Daniel R. Lenz, Joseph H. Bunton
  • Publication number: 20080308728
    Abstract: The present invention relates generally to atom probes, atom probe specimens, and associated methods. For example, certain aspects are directed toward methods for analyzing a portion of a specimen that includes selecting a region of interest and moving a portion of material in a border region proximate to the region of interest so that at least a portion of the region of interest protrudes relative to at least a portion of the border region. The method further includes analyzing a portion of the region of interest. Other aspects of the invention are directed toward a method for applying photonic energy in an atom probe process by passing photonic energy through a lens system separated from a photonic device and spaced apart from the photonic device. Yet other aspects of the invention are directed toward a method for reflecting photonic energy off an outer surface of an electrode onto a specimen.
    Type: Application
    Filed: August 15, 2006
    Publication date: December 18, 2008
    Applicant: Imago Scientific Instruments Corporation
    Inventors: Thomas F. Kelly, Joseph H. Bunton, Scott A. Wiener
  • Publication number: 20070184515
    Abstract: Disclosed are methods to prepare a specimen for microanalysis, the specimens so prepared, and methods to analyze the specimens by atom probe microscopy. The specimens are prepared by embedding a specimen within an electrically conductive matrix to yield an embedded specimen; and then forming regions on the embedded specimen into shapes suitable for microanalysis by an atom probe.
    Type: Application
    Filed: August 6, 2004
    Publication date: August 9, 2007
    Applicant: Imago Scientific Instruments Corporation
    Inventors: Steven Goodman, Thomas Kelly, John Kremer
  • Publication number: 20070181826
    Abstract: A laser atom probe (100) situates a counter electrode between a specimen mount and a detector (106), and provides a laser (116) having its beam (122) aligned to illuminate the specimen (104) through the aperture (110) of the counter electrode (108). The detector, specimen mount (102), and/or the counter electrode may be charged to some boost voltage and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. Automated alignment methods are described wherein the laser is automatically directed to areas of interest.
    Type: Application
    Filed: August 19, 2004
    Publication date: August 9, 2007
    Applicant: Imago Scientific Instruments Corporation
    Inventors: Joseph Bunton, Jesse Olson
  • Patent number: 7157702
    Abstract: A three dimensional atom probe comprising a sharp specimen (10) coupled to a mounting means (12) where emission of charged particles is caused by application of a potential to the specimen tip (10) such that charged particles are influenced by filtering electrodes (206, 204) before impingement on a detection screen (202).
    Type: Grant
    Filed: May 26, 2004
    Date of Patent: January 2, 2007
    Assignee: Imago Scientific Instruments Corporation
    Inventor: Tye Travis Gribb
  • Patent number: 7019307
    Abstract: In detectors for imaging and other applications, delay line anodes are arrayed so as to allow detection of the location and/or timing of particle hits. The anodes are arrayed to provide an upper anode and one or more lower anodes, with particles incident on the upper anode passing in turn to the lower anodes. The anode arrays allow the use of identically manufactured anodes which are maintained in parallel spaced relation along the travel path of the particles of interest without dielectric material or other structure situated between the anodes. The spacing between the anodes is preferably adjustable so as to allow the installer and/or user to modify the performance characteristics of the array. The anodes may be made of pre-formed metal foil signal and ground layers laminated onto opposing sides of a dielectric sheet, or may be etched or otherwise formed from flex circuit material, so that the anodes and the overall array are light weight, compact, and flexible.
    Type: Grant
    Filed: June 25, 2001
    Date of Patent: March 28, 2006
    Assignee: Imago Scientific Instruments Corporation
    Inventors: Tye Travis Gribb, John Joseph Larkin
  • Patent number: 6762415
    Abstract: A vacuum chamber includes chamber walls separating a chamber interior and a chamber exterior, with one or more access ports defined in the chamber walls. A viewing tube extends from the chamber exterior into the chamber interior and terminates in a window. A positioner for imaging devices is then provided within the viewing tube, and is thus situated at least partially within the chamber interior with its imaging device(s) oriented towards the window of the viewing tube to allow imaging of areas within the vacuum chamber. The positioner preferably allows translation and/or rotation of an imaging device within the viewing tube within two perpendicular planes oriented along the axis of the viewing tube, thereby allowing the imaging device to view an area of interest from more angles oriented about the area of interest than would otherwise be possible if the imaging device was situated outside the vacuum chamber.
    Type: Grant
    Filed: April 18, 2003
    Date of Patent: July 13, 2004
    Assignee: Imago Scientific Instruments Corporation
    Inventor: David Robert Strait