Abstract: A laser atom probe (100) situates a counter electrode between a specimen mount and a detector (106), and provides a laser (116) having its beam (122) aligned to illuminate the specimen (104) through the aperture (110) of the counter electrode (108). The detector, specimen mount (102), and/or the counter electrode may be charged to some boost voltage and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. Automated alignment methods are described wherein the laser is automatically directed to areas of interest.

Abstract: A three dimensional atom probe comprising a sharp specimen (10) coupled to a mounting means (12) where emission of charged particles is caused by application of a potential to the specimen tip (10) such that charged particles are influenced by filtering electrodes (206, 204) before impingement on a detection screen (202).

Abstract: In detectors for imaging and other applications, delay line anodes are arrayed so as to allow detection of the location and/or timing of particle hits. The anodes are arrayed to provide an upper anode and one or more lower anodes, with particles incident on the upper anode passing in turn to the lower anodes. The anode arrays allow the use of identically manufactured anodes which are maintained in parallel spaced relation along the travel path of the particles of interest without dielectric material or other structure situated between the anodes. The spacing between the anodes is preferably adjustable so as to allow the installer and/or user to modify the performance characteristics of the array. The anodes may be made of pre-formed metal foil signal and ground layers laminated onto opposing sides of a dielectric sheet, or may be etched or otherwise formed from flex circuit material, so that the anodes and the overall array are light weight, compact, and flexible.

Abstract: A media storage and organization system is comprised of a durable enclosure and a plurality of inserts for holding photographs, negatives, digital computer disks, memory cards, slides, business cards, a calendar, and the like. Inserts are attached to the enclosure by means of a mounting rail, which is integral to a hinge used for connecting a top and bottom covers that form said enclosure.

Abstract: A vacuum chamber includes chamber walls separating a chamber interior and a chamber exterior, with one or more access ports defined in the chamber walls. A viewing tube extends from the chamber exterior into the chamber interior and terminates in a window. A positioner for imaging devices is then provided within the viewing tube, and is thus situated at least partially within the chamber interior with its imaging device(s) oriented towards the window of the viewing tube to allow imaging of areas within the vacuum chamber. The positioner preferably allows translation and/or rotation of an imaging device within the viewing tube within two perpendicular planes oriented along the axis of the viewing tube, thereby allowing the imaging device to view an area of interest from more angles oriented about the area of interest than would otherwise be possible if the imaging device was situated outside the vacuum chamber.

Abstract: Methods of sampling specimens for microanalysis, particularly microanalysis by atom probe microscopy, include steps of forming a study specimen in a first study object (as by use of focused ion beam milling); removing the study specimen from the study object; situating the study specimen on a second study object; and microanalyzing the study specimen. Where the first study object is of particular interest for study, the study specimen may be taken from a functional portion of the first study object so that microanalysis will provide information regarding this functional portion. Where the second study object is of particular interest for study, the second study object may be subjected to manufacturing processes (e.g., deposition of layers of materials) after the study specimen is situated thereon so that the study specimen will provide information regarding the results of the manufacturing process.

Abstract: Methods of sampling specimens for microanalysis, particularly microanalysis by atom probe microscopy, include steps of forming a study specimen in a first study object (as by use of focused ion beam milling); removing the study specimen from the study object; situating the study specimen on a second study object; and microanalyzing the study specimen. Where the first study object is of particular interest for study, the study specimen may be taken from a functional portion of the first study object so that microanalysis will provide information regarding this functional portion. Where the second study object is of particular interest for study, the second study object may be subjected to manufacturing processes (e.g., deposition of layers of materials) after the study specimen is situated thereon so that the study specimen will provide information regarding the results of the manufacturing process.

Abstract: This machine comprises a thermally insulated enclosure, with which are associated a control unit, a temperature source, a device for making the temperature uniform, a specimen holder disposed inside the enclosure and measurement units, means being provided for mounting the various control or monitoring components fixed to the enclosure, whilst permitting the thermal expansions of the enclosure due to temperature differences.Application to the monitoring of components made of shape-memory alloys.

Abstract: A machine for the thermo-mechanical treatment of parts made of memory alloys contains: a thermally insulated chamber connected to a source of gaseous fluid and a support, capable of being introduced into a chamber, for carrying a plurality of crowns superimposed on one another. The parts made of memory alloy are placed between the crowns where the gaseous fluid passes through. Tension is applied to the crown in a controlled operating cycle.

Abstract: A Hinge Assembly for supporting a storge-type door in a cabinet, the assembly including a cabinet plate in the form of a square having guide grooves along two sides, the grooves intersecting at one corner of the square, a door plate mounted on the cabinet plate for rotary motion between a first position in alignment with one edge of the door plate in alignment with one edge of the first plate to a second position with one edge of the door plate in alignment with the other edge of the cabinet first plate, the door plate having two guide members on the one edge, the guide members being aligned in one of the grooves in the first position and moveable into the other of the grooves on rotation of the door plate with respect to the cabinet plate whereby the door plate rotates within the angle formed between the guide grooves, and a pivot post on one of the plates and a guide member on the other of the plate having a track to define the path of motion for the pivot post on rotation of the door plate with respect to

Abstract: Structure to support a large mirror, cupboard doors and hanging cupboard doors with mirrors, two-face partition panels with mirrors or other items, the structure comprising a plurality of lateral sections (10) equipped with means (12-13) to support at least one small mirror (17) and a rear panel (20), a volume of space (22) being included between the lateral sections (10), the at least one small mirror (17) and the rear panel (20), the lateral sections (10) being united by means of angular elements (19) which cooperate with guide means (15-27) and with two neighbouring lateral sections (10) respectively, the lateral sections (10) comprising means (14) to support the rear panel (20), the volume of space (22) being filled with injected foam material which binds solidly together all the elements forming the large mirror.