Patents Assigned to Imarad Imaging Systems Ltd.
  • Patent number: 6765213
    Abstract: A semiconductor coincidence detector device including at least a first and a second detector crystal array, each having a first and second surface, an array of pixellated anodes formed on each of the first surfaces, an array of segmented cathodes formed on each of the second surfaces, essentially each of the pixellated anodes being connected to an anode electronic channel for generating a first electrical signal corresponding to the energy of a photon impinging in the semiconductor, and essentially each of the segmented cathodes being connected to a cathode electronic channel for generating an electrical coincidence trigger signal on detection of a photon impinging in the semiconductor, the first electrical signal being read only from anodes located opposite the cathode segment generating the trigger signal.
    Type: Grant
    Filed: July 30, 2001
    Date of Patent: July 20, 2004
    Assignee: Imarad Imaging Systems Ltd.
    Inventors: Arie Shahar, Uri El-Hanany, Alex Tsigelman, Shimon Klier, Eldan Halberthal
  • Patent number: 6657200
    Abstract: A signal readout system for a solid state detector array comprising a plurality of detection channels, wherein the decision to output a signal detected by a channel is determined by the content of that channel.
    Type: Grant
    Filed: July 30, 2001
    Date of Patent: December 2, 2003
    Assignees: Imarad Imaging Systems Ltd., Integrated Detectors and Electronics (IDE) S.A.
    Inventors: Einar Nygard, Eldan Halberthal
  • Publication number: 20030160175
    Abstract: A signal readout system for a solid state detector array comprising a plurality of detection channels, wherein the decision to output a signal detected by a channel is determined by the content of that channel.
    Type: Application
    Filed: July 30, 2001
    Publication date: August 28, 2003
    Applicant: IMARAD IMAGING SYSTEMS LTD.
    Inventors: Einar Nygard, Eldan Halberthal
  • Publication number: 20030085358
    Abstract: A two-dimensional, pixellated, monolithic semiconductor radiation detector, in which each detector pixel is essentially a perpendicular mode detector. This is achieved by an arrangement of anode spots, one for each pixel located on the flux-exposed front surface of the detector substrate, surrounding by a cathode array preferably in the form of a network of lines, such that the field between the anodes and cathodes on this front surface has a major component in the direction parallel to the surface, and hence perpendicular to the incident photon flux. The conductivity of the substrate is high near this front surface, since this is where the highest level of absorption of photons takes place, and a significant photoconductive current is thus generated between cathodes and anodes. The conductivity is proportional to the incoming photon flux, and decays exponentially with depth into the detector.
    Type: Application
    Filed: October 3, 2002
    Publication date: May 8, 2003
    Applicant: IMARAD IMAGING SYSTEMS LTD.
    Inventors: Uri El-Hanany, Arie Shahar
  • Publication number: 20030010924
    Abstract: A pixelated detector assembly comprising a stack of thin detector crystals, each detector crystal having a pair of planar surfaces bound by edges substantially thinner than the dimensions of the surfaces. The stack is disposed such that the radiation to be detected is incident on one set of edges of the stack of detector crystals. The dimension of the planar surfaces in the general direction of incidence of the radiation incidence is sufficient to ensure that substantially all of the high energy photons to be detected are absorbed within the depth of the detector assembly. Each of the detector crystals has a two-dimensional pixelated anode array formed on one of its planar surfaces. A cathode is formed on its opposite planar surface, preferably covering substantially all of the surface.
    Type: Application
    Filed: June 25, 2002
    Publication date: January 16, 2003
    Applicant: IMARAD IMAGING SYSTEMS LTD.
    Inventors: Uri El-Hanany, Arie Shahar, Shimon Klier, Alex Tsigelman, Eldan Halberthal
  • Publication number: 20020036269
    Abstract: A semiconductor coincidence detector device including at least a first and a second detector crystal array, each having a first and second surface, an array of pixellated anodes formed on each of the first surfaces, an array of segmented cathodes formed on each of the second surfaces, essentially each of the pixellated anodes being connected to an anode electronic channel for generating a first electrical signal corresponding to the energy of a photon impinging in the semiconductor, and essentially each of the segmented cathodes being connected to a cathode electronic channel for generating an electrical coincidence trigger signal on detection of a photon impinging in the semiconductor, the first electrical signal being read only from anodes located opposite the cathode segment generating the trigger signal.
    Type: Application
    Filed: July 30, 2001
    Publication date: March 28, 2002
    Applicant: IMARAD IMAGING SYSTEMS LTD.
    Inventors: Arie Shahar, Uri El-Hanany, Alex Tsigelman, Shimon Klier, Eldan Halberthal
  • Patent number: 6285029
    Abstract: A novel semiconductor detector device, consisting of several layers of two dimensional detector modules each module being divided into an array of separate detector cells by means of the pixelation of the electrodes on the surfaces of the modules. The superimposed detector cells in equivalent positions in each layer are in electrical contact with those in the two immediately adjacent layers, such that the whole device effectively becomes a two dimensional array of stacks of individual detector cells, with a common bottom electrode. Current in each detector cell stack, induced by the absorption of a high energy photon in that stack, is measured by means of an integrating charge sensitive amplifier attached to each anode at the top of each cell stack.
    Type: Grant
    Filed: July 27, 1998
    Date of Patent: September 4, 2001
    Assignee: Imarad Imaging Systems Ltd.
    Inventors: Arie Shahar, Uri El-Hanany, Alex Tsigelman, Shimon Klier, Eldan Halberthal
  • Patent number: 5905264
    Abstract: A semiconductive detector includes a semiconductor substrate having electrodes formed at two opposite-facing surfaces thereof. A peripheral side-wall extends between the two opposite facing-surfaces, and an electrical insulator is formed on at least a portion of the side wall. An electrical conductor is provided over the insulator. A bias voltage may be applied to the conductor such that the electrical insulator and the conductor operate generally in a manner of a field effect transistor.
    Type: Grant
    Filed: August 4, 1997
    Date of Patent: May 18, 1999
    Assignee: Imarad Imaging Systems Ltd.
    Inventors: Arie Shahar, Uri El-Hanany, Alex Tsigelman, Alex Gorin, Shimon Klier, Eldan Halbertal
  • Patent number: 5847398
    Abstract: A gamma ray imaging system for providing high resolution images includes a collimator plate with an array of multiple holes which image a gamma emitting object onto a semiconductor gamma detector pixel array coupled to a signal processor. The collimator holes are smaller than half the pixel pitch. The detector array is moved in steps, with a step-size equal to the pitch of the collimator holes, to successive imaging positions. The hole locations and imaging positions are such that gamma photons do not fall on the dead areas of the pixels. An electronic processing unit constructs from the pixel signals produced at each imaging position, a set of independent equations and solves them to derive the exact image signal of each irradiated area, and uses this data to compose and a display a high resolution gamma image of the object.
    Type: Grant
    Filed: July 17, 1997
    Date of Patent: December 8, 1998
    Assignee: Imarad Imaging Systems Ltd.
    Inventors: Arie Shahar, Uri El-Hanany, Alex Tsigelman, Shimon Klier, Alexander Gorin, Eldan Halberthal