Patents Assigned to IMC Industriellt Mikroelektronikcentrum AB
  • Patent number: 6292089
    Abstract: A structure for temperature sensors and infrared detectors. The structure is built-up on a substrate that includes a thermistor layer, wherein the resistance of the thermistor layer is temperature dependent. The substrate also includes an electric contact layer on both sides of the thermistor layer, and the resistance of the thermistor layer is measured between the contact layers. The thermistor layer includes a monocrystalline quantum well structure that includes alternating quantum well layers and barrier layers. One or more of the bandedge energy of the barrier layers, the quantum well layer doping level, the quantum well layer thickness, and the barrier layer thickness is adapted to obtain a temperature coefficient predetermined for the structure.
    Type: Grant
    Filed: July 10, 1998
    Date of Patent: September 18, 2001
    Assignee: IMC Industriellt Mikroelektronikcentrum AB
    Inventor: Jan Andersson