Abstract: A measuring device for determining the location of one or more measurement points relative to the measuring device. The measuring device is arranged to be coupled to a non-contact distance measuring device (EDM) and one or more sensors for determining the EDM's orientation. The measuring device comprises an image capture device (ICD) operable to output digital images and being arranged to be coupled to the EDM such that the ICD moves in known registration with respect to the EDM. A controller is arranged to receive data from the one or more sensors and the ICD. The controller can associate an image with the orientation of the EDM during exposure of the image, locate one of the measurement points within the image, and use the location of the measurement point within the image and the EDM's orientation to establish the direction of the measurement point with respect to the measuring device.

Abstract: A measuring device (10) for determining the location of one or more measurement points relative to the measuring device. The measuring device is arranged to be coupled to a non-contact distance measuring device or EDM (12) and one or more sensors (16) for determining the orientation of the EDM. The measuring device comprises an image capture device or ICD (20) operable to output digital images and being arranged to be coupled to the EDM such that the ICD moves in known registration with respect to the EDM. A controller (28) is arranged to receive data from the one or more sensors and the ICD. The controller is configured to: a) associate an image with the orientation of the EDM during exposure of the image; b) locate one of the measurement points within the image; and c) use the location of the measurement point within the image in combination with the EDM orientation to establish the direction of the measurement point with respect to the measuring device.

Abstract: The position of a feature within an image is determined by determining an initial estimate of the feature position to within a fraction of a pixel, translating the feature by an amount equal to that fraction of a pixel, determining a further estimate of the translated feature position to within a fraction of a pixel and summing the pixel fraction of the previous estimate with the further estimate of the position to arrive at a refined estimate of the feature position.