Abstract: A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product.

Abstract: A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product.

Abstract: The invention relates to an arrangement for contactless determination of at least one dimension of a moving material web, in particular a material web of opaque material, with a background illumination, with optical detection means for detecting at least one current contrast image and with evaluation means, wherein the background illumination is arranged opposite the optical detection means, wherein the material web moves in a plane between the at least one optical detection means and the background illumination, and wherein the current contrast image has at least one piece of information about at least one light intensity laterally adjacent to the material web. Furthermore, the present invention concerns a corresponding process.

Abstract: The invention relates to a method for the geometrical measurement of a material strip (2), whereby the material strip (2) defines a longitudinal direction, whereby, by means of a first measuring device with at least one radiation source (6) and with at least one detector (8), the strip thickness of the material strip (2) is determined, whereby for this purpose the radiation (10) from the radiation source (6) penetrates the material strip (2) at at least one measurement point (12) arranged in the material strip (2), and the resultant weakening of the intensity of the radiation (10) is determined by the corresponding detector (8). It is proposed that, by means of a second measuring device, the transverse contour of the material strip (2) is determined. In this situation, the measurement of the strip thickness and the transverse contour is effected at the same place on the material strip. The measured values of the thickness measurement are corrected with the measured values of the transverse contour.

Abstract: The invention relates to a method for the geometrical measurement of a material strip (2), whereby the material strip (2) defines a longitudinal direction, whereby, by means of a first measuring device with at least one radiation source (6) and with at least one detector (8), the strip thickness of the material strip (2) is determined, whereby for this purpose the radiation (10) from the radiation source (6) penetrates the material strip (2) at at least one measurement point (12) arranged in the material strip (2), and the resultant weakening of the intensity of the radiation (10) is determined by the corresponding detector (8). It is proposed that, by means of a second measuring device, the transverse contour of the material strip (2) is determined. In this situation, the measurement of the strip thickness and the transverse contour is effected at the same place on the material strip. The measured values of the thickness measurement are corrected with the measured values of the transverse contour.

Abstract: A method for determining the flatness of a material strip and a device for performing the method. The method and device solve the technical problem of calculating the strip elongation from values of the strip contour and thus determining the flatness of the material strip. This problem is solved according to the present invention by a method in which, from the changes of slope values measured at a plurality of measurement points, the wavelength and phase of these changes are calculated. Therefrom there is calculated the position of at least one extremum, at which the measured slope values have only a transverse component. The slopes are summed to calculate a contour, from which the amplitude is calculated. The strip elongation as a measure of the flatness of the material strip is then determined from the wavelength and amplitude.

Abstract: A process for the determination of the thickness transverse profile and the thickness longitudinal profile of a running material strip.