Patents Assigned to In-Depth Test LLC
  • Methods and apparatus for data analysis
    Patent number: 11853899
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to test a set of components and generate test data for the components. A diagnostic system automatically analyzes the test data to identify a characteristic of a component fabrication process by recognizing a pattern in the test data and classifying the pattern using a neural network.
    Type: Grant
    Filed: May 29, 2018
    Date of Patent: December 26, 2023
    Assignee: In-Depth Test LLC
    Inventor: Deana Delp