Abstract: A programmable low profile universally selectable burn-in board is described comprising a mother board having a top surface and a bottom surface, a plurality of test socket means for a corresponding number of devices under test, a program card, male and female connectors for removably mounting the socket means to the top surface of the mother board and male and female connectors for mounting the program card to the bottom surface of the mother board. The mother board is further provided with a frame for providing strength and rigidity to the mother board. In one embodiment, a chamber is provided for enclosing the program card in such a manner that refrigerated air, dry nitrogen or other types of gases or fluids, is forced into the space provided thereby so as to reduce the operating temperature of the program card and its timing/driving/signal routing/signal processing components.