Patents Assigned to INDATECH
  • Patent number: 8730467
    Abstract: A method for detecting by spectroscopy an inhomogeneity (I) in a sample (E), includes that (i) the sample (E) is illuminated with incident light using means (23) for illuminating the sample (E), and (ii) the light re-emitted by the sample (E) is collected using means (24; 24?) for collecting the light, wherein (i) the light re-emitted by the sample (E) is collected at different spots arranged each spaced apart from the other spots and being located at the same distance from the means (23) for illuminating this sample (E) or their barycenter, and (ii) the presence of an inhomogeneity (I) in the sample (E) is determined based on the signals corresponding to the light re-emitted and collected at least at two different spots. A spectroscopic probe (2) and a device for analyzing a sample by spectroscopy implementing the method are also disclosed.
    Type: Grant
    Filed: January 28, 2010
    Date of Patent: May 20, 2014
    Assignee: Indatech
    Inventors: Fabien Chauchard, Sylvie Roussel
  • Publication number: 20100302538
    Abstract: The invention relates to a spectroscopic probe (2) for a device for analyzing a sample by spectroscopy, and including: means (23) for illuminating the sample to be analyzed with incident light; means (24; 24?) for collecting light re-emitted by this sample; a contact surface (22), oriented towards the sample, at the level of or proximate which (22) the means (23) for illuminating the sample and/or the means (24; 24?) for collecting the re-emitted light are located. This probe (2) is characterized in that the means (24; 24?) for collecting the light re-emitted by the sample constitute at least one set (25; 25?) of means (24; 24?) for collecting this re-emitted light, such a set (25; 25?) including a plurality of these means (24a, 24b, 24c) for collecting the re-emitted light, each arranged spaced apart from the other ones and at the same distance from the means (23) for illuminating the sample or their barycenter.
    Type: Application
    Filed: January 28, 2010
    Publication date: December 2, 2010
    Applicant: INDATECH
    Inventors: Fabien CHAUCHARD, Sylvie ROUSSEL
  • Publication number: 20100302537
    Abstract: The invention relates to a spectroscopy device (1) for analyzing a sample (E) and including at least one spectroscopic probe (2) provided with: means for illuminating the sample (E); means for collecting light re-emitted by the sample (E); a contact surface (22) oriented towards the sample (E), at the level of or near which (22) the illuminating means and/or the collecting means are located and including at least a means (26a; 26b) for receiving the re-emitted light. This device (1) is characterized in that: the probe (2) includes at least two different receiving means (26a; 26b) having, each (26a; 26b), a index absorption, reflection and/or diffusion different, and each (26a; 26b) associated to at least part of the collecting means and/or; the device (1) includes an element (5) interposed between the contact surface (22) and the sample (E) to be analyzed, and designed to diffuse at least the incident light.
    Type: Application
    Filed: January 28, 2010
    Publication date: December 2, 2010
    Applicant: INDATECH
    Inventors: Fabien Chauchard, Sylvie Roussel