Patents Assigned to INDE SYSTEM CO., LTD.
  • Publication number: 20120192651
    Abstract: Multi probe unit for an ultrasonic flaw detection apparatus, includes a plurality of probes contacting a surface of an object to be inspected; a plurality of connection members connecting two neighbor probes of the plurality of probes with each other; support members disposed on top portions of the plurality of probes so as to be spaced apart from the plurality of probes; and a pressing member connecting the plurality of probes with the support member and pressing the plurality of probes to the object to be inspected. According to the present invention, a plurality of probes smoothly contacts a flexural surface of an object to be inspected.
    Type: Application
    Filed: September 1, 2010
    Publication date: August 2, 2012
    Applicants: INDE SYSTEM CO., LTD., KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Seung Seok Lee, Ki Bok Kim, Young Gil Kim, Hyun Jae Shin, You Hyun Jang