Abstract: Disclosed are a method for obtaining a full reflectance spectrum of a surface and an apparatus therefor. The method for obtaining a full reflectance spectrum of a surface, comprises the steps of: (a) calculating a combination value of spectral characteristics of a light source and response characteristics of a camera for an image of a reference object, the full reflectance spectrum of a surface of which is known, by utilizing the known full reflectance spectrum of a surface; (b) obtaining an image by photographing an object irradiated with light according to a predetermined lighting environment; and (c) obtaining a full reflectance spectrum of a surface for the object by utilizing the combination value of the spectral characteristics of the light source and the response characteristics of the camera for the image.
Type:
Grant
Filed:
May 12, 2014
Date of Patent:
October 3, 2017
Assignee:
INDUSTRY-UNUIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY
Inventors:
Jong-Il Park, Moon-Hyun Lee, Byung-Kuk Seo