Abstract: A particle detector includes at least one throttling element which defines an aerodynamic aperture. A light source illuminates a region of the aerodynamic aperture at about a focal point of an aerodynamic lens. A detector is configured to receive a light scattered from one or more particles which traverse the aerodynamic aperture. A method for detecting and measuring particles previously deposited on a surface of a semiconductor manufacturing chamber is also described.
Type:
Application
Filed:
November 14, 2023
Publication date:
May 16, 2024
Applicant:
Inficon, LLC
Inventors:
Shawn Briglin, Nathan Graff, Silvio Decker, Michael Haggmark