Abstract: Disclosed is a method, circuit and system for determining a Lowest Operative Threshold Voltage Level for one or more cell segments/blocks/sets of a NVM array and a corresponding device, adapted to compare substantially native state NVM cells in a block of cells against one or more reference cells/structures or offset values, and to maintain a read error count.
Abstract: Disclosed are methods, data-structures, circuits, devices and system for operating a non-volatile memory device. According to some embodiments, a controller may operate on different portions (e.g. clusters) of a NVM memory array differently, depending upon a designation of a given portion within a table stored on the array. Portions of the array may be operated in OTP page write mode, while other portions of the array may be operated in either bit level or byte level append modes.
Abstract: The invention provides a method of managing bad block in a data storage device having an OTP memory die in order to present a continues address space toward the user, by using some of the OTP memory space for the management and maintaining address replacement table. Fast and efficient programming and reading algorithms are presented.
Abstract: A memory chip includes memory cells storing data to be read, at least one reference cell having a reference cell current level, at least one reference gate voltage memory cell storing a reference gate voltage value and a read circuit to read the memory cells with a fixed gate voltage with respect to at least one reference cell activated at a voltage having its associated stored reference gate voltage value.
Abstract: A memory chip includes memory cells storing data to be read; at least one reference cell having a reference cell current level and a reference gate voltage adjuster to adjust, for each reference cell, a reference gate voltage level to compensate for a shift of the reference cell current level from an original current level.
Abstract: The invention provides a method of managing data updates in DOS-based data storage device having an OTP memory die that includes a code region having a first memory capacity and a code region access resolution and a data region having a second memory capacity and a data region access resolution. The second memory capacity is larger than the first memory capacity and the code region access resolution is finer than the data region access resolution. The method includes chronologically writing a log entry in the code region indicating the change in FAT and root directory for each change in user data written in the data region.
Abstract: The invention provides a method of managing bad block in a data storage device having an OTP memory die in order to present a continues address space toward the user, by using some of the OTP memory space for the management and maintaining address replacement table. Fast and efficient programming and writing algorithms are presented.
Type:
Application
Filed:
December 8, 2008
Publication date:
June 10, 2010
Applicant:
Infinite Memories Ltd.
Inventors:
Amir GABAI, Yoav Yogev, Dror Avni, Eli Lusky
Abstract: The invention provides a method of managing bad block in a data storage device having an OTP memory die in order to present a continues address space toward the user, by using some of the OTP memory space for the management and maintaining address replacement table. Fast and efficient programming and reading algorithms are presented.
Abstract: The invention provides a method of managing data updates in DOS-based data storage device having an OTP memory die that comprises a code region having a first memory capacity and a code region access resolution and a data region having a second memory capacity and a data region access resolution. The second memory capacity is larger than the first memory capacity and the code region access resolution is finer than the data region access resolution. The method comprises chronologically writing a log entry in the code region indicating the change in FAT and root directory for each change in user data written in the data region.
Abstract: OTP Data storage die and device consisting of novel OTP (One-Time-Programming) NVM (Non-Volatile-Memory) die is disclosed. The OTP Data storage device can be used in typical host applications with standard interface protocols and file system. The novel OTP memory is a dual memory with both RAM (random access memory) capability and NAND Flash like interface. These features enable to achieve efficient management capabilities and dense array for the OTP data storage device.