Abstract: A test probe (10) for contactlessly measuring the electromagnetic properties of a radio unit (20), in particular an antenna unit, having a hollow conductor (1) for transmitting electromagnetic waves, a filling element (2) which is disposed in the hollow conductor and made of a dielectric material, a lens element (3) which is disposed on the end face of the hollow conductor (1) and made of a dielectric material for coupling electromagnetic waves into the hollow conductor (1), and a contact portion (4) which is disposed on the hollow conductor end opposite the lens element (3) and which serves to decouple a measurement signal.

Abstract: The invention relates to a high-frequency test connector device (12; 12?) having an adapter housing including a sleeve-like ground contact section (10; 10?) axially at one end, (18) at the other end, and centrally an insulated inner contact (20), wherein the ground contact section has an electrically conducting spring member (26; 26?, 28; 42, 44; 44?, 46) for ground contact, associated such that for engaging over the sleeve section (14) of the contacting partner (16), the latter with an end face (30), to form a contact and resiliently along the movement or connecting longitudinal axis, can engage on the spring member (26) formed in a sleeve base of the ground contact section (10), or wherein, for engaging in the sleeve section (14?) of the connecting partner (16?), the spring member (26?) projects from an end face end section of the ground contact section (10?), to form a contact and resiliently along the longitudinal axis, can engage on a ground-conducting inner section (40) of the connecting partner.

Abstract: The invention relates to a marking device (02) for marking circuit boards (04) tested by means of a test device (01, 08), wherein the marking device (02) can be fixed to the test device (01, 08) in a defined target position, and wherein the marking device (02) has a marking member (06) which can engage the surface (05) of a circuit board (04), and wherein the marking member (06) can be driven by a drive mechanism (16) in order to apply a marking to the surface (05) of the circuit board (04) by an operating movement of the marking member (06) depending on the test result. The marking device (02) includes a fixation module (10) and a quick change module (11), wherein the marking device (02) can be fixed to the test device (01, 08) in the defined target position by means of the fixation module (10), and wherein the quick change module (11) includes the marking member (06) and the drive mechanism (16), and wherein the quick change module (11) can be replaced without removing the fixation module (10).

Abstract: The invention relates to a high-frequency test connector device (12; 12?) having an adapter housing including a sleeve-like ground contact section (10; 10?) axially at one end, (18) at the other end, and centrally an insulated inner contact (20), wherein the ground contact section has an electrically conducting spring member (26; 26?, 28; 42, 44; 44?, 46) for ground contact, associated such that for engaging over the sleeve section (14) of the contacting partner (16), the latter with an end face (30), to form a contact and resiliently along the movement or connecting longitudinal axis, can engage on the spring member (26) formed in a sleeve base of the ground contact section (10), or wherein, for engaging in the sleeve section (14?) of the connecting partner (16?), the spring member (26?) projects from an end face end section of the ground contact section (10?), to form a contact and resiliently along the longitudinal axis, can engage on a ground-conducting inner section (40) of the connecting partner.

Abstract: The invention relates to a marking device (02) for marking circuit boards (04) tested by means of a test device (01, 08), wherein the marking device (02) can be fixed to the test device (01, 08) in a defined target position, and wherein the marking device (02) has a marking member (06) which can engage the surface (05) of a circuit board (04), and wherein the marking member (06) can be driven by a drive mechanism (16) in order to apply a marking to the surface (05) of the circuit board (04) by an operating movement of the marking member (06) depending on the test result. The marking device (02) includes a fixation module (10) and a quick change module (11), wherein the marking device (02) can be fixed to the test device (01, 08) in the defined target position by means of the fixation module (10), and wherein the quick change module (11) includes the marking member (06) and the drive mechanism (16), and wherein the quick change module (11) can be replaced without removing the fixation module (10).

Abstract: A high-frequency test probe device comprising a contact section (18) which forms an inner contact (40) and an outer contact (44), which is designed to interact with a contact partner (30) that is to be contacted for testing purposes, and which is provided on an inner housing (16) at one end and can be contacted at a pickup end (20) for signal pickup at the other end. The inner housing is guided at least along some sections in an outer housing (10) and in an axially movable manner relative to same.

Abstract: A high-frequency test probe device comprising a contact section (18) which forms an inner contact (40) and an outer contact (44), which is designed to interact with a contact partner (30) that is to be contacted for testing purposes, and which is provided on an inner housing (16) at one end and can be contacted at a pickup end (20) for signal pickup at the other end. The inner housing is guided at least along some sections in an outer housing (10) and in an axially movable manner relative to same.