Abstract: Photodiode systems, methods, devices, and circuitries are provided for determining a material property and/or determining environmental characteristics. In one embodiment, a measurement device includes a first member, a second member rotatably coupled to the first member at a pivot that affixes the first member to the second member. The first member and the second member are configured to pivot between a closed position, where the first member and the second member contact one another, and an open position where the first member is rotatably separated from the second member. An infrared emitter is disposed within the first member, the infrared emitter faces the second member. An infrared sensor is disposed within the second member facing the first member, where when the first member and the second member are in the closed position, the infrared emitter and the infrared sensor are misaligned.

Abstract: Systems, methods, devices, and circuitries are provided for determining a material property. In one embodiment, a method includes applying non-thermal energy to a first side of a material sample; sensing, a response of the material sample to the non-thermal energy; generating non-thermal data indicative of the response; and determining a thermal property of the material sample based on the non-thermal data. In one embodiment, the method also includes determining an environmental characteristic; determining a suitability of the material sample based on the thermal property and the environmental characteristic; and displaying information related to the suitability.