Patents Assigned to Innov-X Systems, Inc.
  • Patent number: 8064570
    Abstract: A hand-held XRF analyzer including an x-ray source for emitting x-rays through a window to a sample. A detector behind the window is responsive to x-rays irradiated by the sample. A controlled volume about the x-ray source and the detector is maintained in a vacuum or a predetermined purge condition for a predetermined amount of time for increasing the sensitivity of the analyzer. A processor is responsive to the detector for analyzing the spectrum of irradiated x-rays and responsive to a pressure sensor for detecting a pressure change inside the controlled volume. The processor is configured to detect if the vacuum or the predetermined purge condition has been compromised.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: November 22, 2011
    Assignee: Innov-X-Systems, Inc.
    Inventors: Bridget Tannian, Brad Hubbard-Nelson, Alfred Oleru
  • Patent number: 7535989
    Abstract: An XRF system including an analyzer with a sample bottle holder, an x-ray source positioned to emit x-rays into a sample bottle placed in the holder, and a detector positioned to receive x-rays emitted by a sample in the sample bottle positioned in the sample bottle holder. A supply of sample bottles receivable in the sample bottle holder, each sample bottle including a first cap with the window therein for allowing x-rays to pass there through when the sample bottle is positioned in the holder, and a second cap without a window for transporting and storing the sample.
    Type: Grant
    Filed: October 17, 2006
    Date of Patent: May 19, 2009
    Assignee: Innov-X Systems, Inc.
    Inventors: Ronald H. Russell, Peter John Hardman, Bradley Hubbard-Nelson
  • Patent number: 7440541
    Abstract: A dual source tube XRF system and method wherein a first x-ray source is employed to direct x-rays in a first energy band at a sample and at least a second x-ray source is employed to direct x-rays in a second energy band at the sample. A detector is responsive to x-rays emitted by the sample after irradiation by the first and second x-ray sources. An analyzer is responsive to the detector and is configured to determine the amount of at least a first substance in the sample based on irradiation of the sample by the first x-ray source and to determine the amount of at least a second substance in the sample based on irradiation of the sample by the second x-ray source. A controller is responsive to the analyzer and is configured to energize the first and second x-ray sources either simultaneously or sequentially.
    Type: Grant
    Filed: December 27, 2006
    Date of Patent: October 21, 2008
    Assignee: Innov-X-Systems, Inc.
    Inventors: Bradley Hubbard-Nelson, Peter John Hardman
  • Patent number: 7430274
    Abstract: An XRF system, preferably handheld, includes an X-ray source for directing X-rays to a sample, a detector responsive to X-rays emitted by the sample, and a filter assembly with multiple filter materials located between the X-ray source and the detector. An analyzer is responsive to detector and is configured to analyze the intensities of X-rays irradiated by the sample at one power setting and to choose a filter material which suppresses certain intensities with respect to other intensities. A device, controlled by the analyzer, automatically moves the filter assembly to the chosen filter material and then the analyzer increases the power setting to analyze certain non-suppressed intensities.
    Type: Grant
    Filed: February 27, 2007
    Date of Patent: September 30, 2008
    Assignee: Innov-X-Systems, Inc.
    Inventors: Brendan Connors, Brad Hubbard-Nelson, Don Sackett
  • Patent number: 7286633
    Abstract: A fuel analysis system and method wherein an x-ray source emits x-rays at an energy level below but proximate the absorption edge of sulfur. A monochromator is in the optical path between the source and a fuel sample for directing x-rays at a single energy level at the fuel sample to limit excitation of any sulfur in the fuel sample. A detector is responsive to x-rays emitted by the sample and an analyzer is responsive to the detector and configured to determine the amount of silicon and aluminum in the sample.
    Type: Grant
    Filed: October 24, 2006
    Date of Patent: October 23, 2007
    Assignee: Innov-X Systems, Inc.
    Inventors: Peter John Hardman, Bradley Hubbard-Nelson