Abstract: Devices and methods for improved inspections of conducting structures of different shapes. An eddy-current probe includes an excitation coil unit, a magnetic detector within the probe, a signal-conditioning/preamplifier circuit within the probe, and a signal channel. The excitation coil unit is shielded on substantially all sides except an emission face that transmits an alternating magnetic signal to a conducting (e.g., metal) object, such that the metal object modifies the alternating magnetic signal. The magnetic detector within the probe is also shielded on substantially all sides except a reception face, such that the alternating magnetic signal as modified by the metal object is received into the shielded magnetic detector and converted into a first electrical signal. The signal-conditioning/preamplifier circuit within the probe is shielded on substantially all sides and provided with electrical power.