Abstract: The present disclosure relates to a measuring system for measuring a measured object, in particular a plastic profile, said measuring system comprising: an antenna arrangement of THz transceivers each at times actively emitting a THz transmission beam and passively receiving reflected THz radiation, where said antenna arrangement outputs measuring signals of the measurements of the THz transceivers, an adjustment means for adjusting the antenna arrangement into several measuring positions along an adjustment direction, a control and evaluation device for receiving and evaluating the measuring signals which is configured such that the measuring signals are evaluated by means of a synthetic aperture radar evaluation process and a virtual model of the boundary surfaces of the measured object is created, and subsequently the control and evaluation device determines layer thicknesses between the boundary surfaces from the virtual model.

Abstract: The invention relates to a preferably portable THz measuring apparatus (1) for determining impurities (3) in a, in particular, stationary measured object (2), the THz measuring apparatus (1) comprising: an antenna array (4) including at least one active THz transmitter, e.g. transceiver (12), emitting a THz transmission beam (15) along an optical axis (A), and a plurality of THz receivers (14), arranged under a fixed spatial arrangement in relation to the THz transmitter (12) and synchronised with the THz receiver, detect reflected THz radiation (16) and putting out THz measuring signals (S1), a controller device (5), receiving the THz measuring signals (S1) and determining impurities (3) as reflections having occurred outside ordinary boundary surfaces (2a, 2b) of the measured object (2). Hereby, the THz-Receiver (14) may also transmit temporarily, in particular alternatingly.

Abstract: The invention relates to a terahertz measuring apparatus (1) for run-time measurements of test objects (8), in particular, for layer thickness measurements and distance measurements of the test objects (8), whereby the terahertz measuring apparatus (1) comprises: a transmitter and receiver unit (2) for emitting a terahertz radiation (10) along an optical axis (A) and for receiving reflected terahertz radiation, a controller and evaluation unit (3) for driving the transmitter and receiver unit (2) and evaluating measuring signals (M) of the transmitter and receiver unit (2).

Abstract: A method and device for measuring the layer thickness of an object. Initially, an object with a layer thickness is provided. Thereupon, at least two measurement steps are performed, where electromagnetic radiation with frequencies in a frequency band associated with the respective measurement step is radiated on the object in each case. The frequency bands are different portions of one bandwidth. Secondary radiation emanating from the boundary surfaces of the object is detected and a measurement signal associated with the measurement step is ascertained. The measurement signals are combined according to the respective frequency bands associated with the measurement steps in order to form an evaluation signal; a fundamental frequency is determined therefrom, and the layer thickness is calculated. A large bandwidth can be realized by a narrow-bandwidth measurement steps by the method. As a result, physical limits of known methods are overcome, and the measurement accuracy is increased.

Abstract: Method for determining at least one layer property of a layer to be determined, in particular a foam layer, in an extrusion process, where a supply material is at least partially foamed and an extrusion product with the foam layer is put out (in other words, is output). The method has at least the steps of irradiating the extrusion product using electro-magnetic radiation, and electro-magnetically measuring at least one radiation having travelled through the foam layer. Measuring at least one feed-in rate or feed-in volume of the supply material, and determining the at least one material property of the layer to be determined from the measured feed-in volume and the electro-magnetic measurement.

Abstract: The invention relates to a THz measuring device (1) for determining at least one layer thickness (a1, a2, a3, a4) of a test object (20, 120, 220), the measuring device Messgerät (1) comprising: a THz transmitter and receiver unit (14) for emitting THz radiation (15) along an optical axis (A) and for receiving reflected THz radiation (16) along the optical axis (A), a controller unit (10) for driving the transmitter and receiver unit (14) Hereby, the THz measuring device (1) is preferably portable including a grip region (34) for grabbing and positioning by the operator, whereby it comprises, at a front end are (5), in particular, a moulded screen (5), a support contour (7) including several support points (P, P1, P2, P3, P4) for being applied to a curved surface (18) of the test object (20, 120, 220), for perpendicular positioning on the surface (18, 118, 218).

Abstract: The invention relates to a terahertz measuring apparatus (1) for measuring a test object (2) by means of a run-time measurement while determining at least one distance (d1, d2, d3, d4), said terahertz measuring apparatus (1) comprising: a terahertz transmitter and receiver unit (3) for emitting terahertz radiation (5) and detecting the terahertz radiation reflected by the test object (2), and an evaluation unit (12) for determining a run-time of the terahertz radiation and at least one distance of the test object (2), Hereby, it is provided, that at least one, preferably several passive terahertz receiver devices (4) are provided the optical axes (C-4) of which are arranged shifted or angled in relation to the optical axis (C-3) of the terahertz transmitter and receiver unit (3) and detect a second reflected terahertz radiation (6b) emitted by the terahertz transmitter and receiver unit (3) and reflected on the test object (2), a data connection (10) for synchronising the terahertz transmitter and receive

Abstract: The invention relates to a terahertz measuring apparatus (1) for run-time measurements of test objects (8), in particular, for layer thickness measurements and distance measurements of the test objects (8), whereby the terahertz measuring apparatus (1) comprises: a transmitter and receiver unit (2) for emitting a terahertz radiation (10) along an optical axis (A) and for receiving reflected terahertz radiation, a controller and evaluation unit (3) for driving the transmitter and receiver unit (2) and evaluating measuring signals (M) of the transmitter and receiver unit (2).

Abstract: The invention relates to a method and a terahertz measuring apparatus for measuring a layer thickness and/or a distance, wherein at least one terahertz beam (7a) is radiated from a terahertz transmission and reception unit (4) along an optical axis (C) onto the measurement object (2, 102) and terahertz radiation (7) that has passed through at least one layer (3) of the measurement object (2, 102) and having been reflected is detected wherein a measurement signal (A) of the detected reflected terahertz radiation (7b) is evaluated and a layer thickness (d) is ascertained from a propagation time difference (t2?t1) of the radiation (7) reflected at boundary layers (2a, 2b) of the layer (3).

Abstract: The invention relates to a terahertz measuring device (1) for measuring a test object (7), comprising: a THz transmitter and receiver unit (2) for emitting terahertz radiation (3) at a spatial angle of emittance (4) along an optical axis (A), receiving reflected terahertz radiation (8) and generating a signal amplitude (S) as a function of the time or frequency (t, f), and a controller and evaluator device (12) for receiving and evaluating the signal amplitude (S). Hereby, the controller and evaluator device (12) determines defects (10, 110) of the test object (7) from the signal amplitude (S). In particular, it is possible to mask a core area (4a) of the emitted terahertz radiation (3). An alternative measuring arrangement can reveal defects also by injecting the THz radiation at a right angle in that additional measuring peaks are detected which cannot be associated with the layer thickness measurement as such.

Abstract: The invention relates to a terahertz measuring apparatus (1) for measuring a test object (2) by means of a run-time measurement while determining at least one distance (d1, d2, d3, d4), said terahertz measuring apparatus (1) comprising: a terahertz transmitter and receiver unit (3) for emitting terahertz radiation (5) and detecting the terahertz radiation reflected by the test object (2), and an evaluation unit (12) for determining a run-time of the terahertz radiation and at least one distance of the test object (2), Hereby, it is provided, that at least one, preferably several passive terahertz receiver devices (4) are provided the optical axes (C-4) of which are arranged shifted or angled in relation to the optical axis (C-3) of the terahertz transmitter and receiver unit (3) and detect a second reflected terahertz radiation (6b) emitted by the terahertz transmitter and receiver unit (3) and reflected on the test object (2), a data connection (10) for synchronising the terahertz transmitter and receive

Abstract: The invention relates to a THz measuring device (1) for determining at least one layer thickness (a1, a2, a3, a4) of a test object (20, 120, 220), the measuring device Messgerät (1) comprising: a THz transmitter and receiver unit (14) for emitting THz radiation (15) along an optical axis (A) and for receiving reflected THz radiation (16) along the optical axis (A), a controller unit (10) for driving the transmitter and receiver unit (14) Hereby, the THz measuring device (1) is preferably portable including a grip region (34) for grabbing and positioning by the operator, whereby it comprises, at a front end are (5), in particular, a moulded screen (5), a support contour (7) including several support points (P, P1, P2, P3, P4) for being applied to a curved surface (18) of the test object (20, 120, 220), for perpendicular positioning on the surface (18, 118, 218).

Abstract: The invention relates to a terahertz measuring device (1) for measuring a test object (7), comprising: a THz transmitter and receiver unit (2) for emitting terahertz radiation (3) at a spatial angle of emittance (4) along an optical axis (A), receiving reflected terahertz radiation (8) and generating a signal amplitude (S) as a function of the time or frequency (t, f), and a controller and evaluator device (12) for receiving and evaluating the signal amplitude (S). Hereby, the controller and evaluator device (12) determines defects (10, 110) of the test object (7) from the signal amplitude (S). In particular, it is possible to mask a core area (4a) of the emitted terahertz radiation (3). An alternative measuring arrangement can reveal defects also by injecting the THz radiation at a right angle in that additional measuring peaks are detected which cannot be associated with the layer thickness measurement as such.

Abstract: The present invention relates to a seal device for a negative pressure calibrating unit in a extrusion line for producing profiled plastic sections, in particular pipes whereby the inner face of a seal rests against the circumference of the extruded profiled section in a formfitting manner and the seal is radially supported on the profiled section in order to apply a sealing force. It is the object of the invention to provide another similar device which is very easily constructed and can be produced inexpensively. This task is solved in that the seal is a porous and elastic foam body (13), the surfaces (17, 19) of that are exposed to the atmosphere are coated with an air-tight coating (21).

Abstract: The invention relates to a method and a terahertz measuring apparatus for measuring a layer thickness and/or a distance, wherein at least one terahertz beam (7a) is radiated from a terahertz transmission and reception unit (4) along an optical axis (C) onto the measurement object (2, 102) and terahertz radiation (7) that has passed through at least one layer (3) of the measurement object (2, 102) and having been reflected is detected wherein a measurement signal (A) of the detected reflected terahertz radiation (7b) is evaluated and a layer thickness (d) is ascertained from a propagation time difference (t2?t1) of the radiation (7) reflected at boundary layers (2a, 2b) of the layer (3).

Abstract: Measuring device for measuring test objects includes a transmitter-receiver unit and a corresponding mirror arrangement. Mirror arrangement has a first mirror forming a first focal point and a second focal point in an x-y plane, and first mirror is, at least sectionally, elliptically curved for deflecting radiation between the focal points. Mirror arrangement includes a second mirror arranged in region of first focal point, second mirror is used for deflecting radiation between a z-direction extending transversely to the x-y plane and between the x-y plane. Test object to be measured is arranged in region of second focal point by a test object holder. Radiation reflected on test object is evaluated by a control unit. Measuring device allows measuring of test object in simple and flexible way, in particular measurement over the entire circumference of test objects in form of plastic pipes having circular cross sections.

Abstract: A measuring device for reflection measurements of test objects includes a transmitter for emitting radiation, a first collimation element for aligning the emitted radiation, a first focusing element for focusing emitted radiation in relation to the test object, and a receiver for detecting radiation reflected by the test object. There is a second collimation element for aligning the reflected radiation, and a second focusing element for focusing the reflected radiation in relation to the receiver. At least two of the first and second collimation elements and first and second focusing elements are separate from each other. Thus, a simple and flexible design of the measuring device is achieved, which can be adapted to the test object.

Abstract: An extrusion line for the production of peroxide cross-linked polyethylene pipes includes a cross-linking oven (5, 13) having an actuated deflection roller (7). The cross-linking oven has a first heating section (A) that extends from an inlet to said deflection roller (7) and a second heating section (B) that extends from said deflection roller to an outlet. An element is provided for adjusting a height of the deflection roller (7) and an angle of the first and second heating sections (A, B) relative to a horizontal plane.

Abstract: A method and apparatus for moving along a tube extrusion line. An extruded tube is pushed through the extrusion line, by means of pressure generated by an extruder, to a withdrawal unit that takes over further driving of the tube. In a first-moving along phase, in which the tube has not yet passed a sealing of a calibration cooling unit relative to the atmosphere, the latter is under atmospheric pressure. In a second phase, in which the tube has passed the sealing, the calibration and cooling unit is placed under underpressure. In the first phase, the tube is supported either by internal overpressure or by a mechanical inner guide. A support cylinder extends axially from a casing head of the extruder and extends coaxially into a calibration sleeve in a first section of the calibration and cooling unit. A support plate is disposed between the casing head and an inlet of the calibration sleeve and provides external support for a tube exiting the casing head.

Abstract: A method and extrusion line for producing peroxide-cross-linked polyethylene pipes in an extrusion line having an extruder, a cross-linking furnace and a flue. The extruded tube is subjected to a stretching process, and the cross-linking furnace has a first heating section that extends from its inlet to an actuated deflection roller and a second heating section from the deflection roller to its outlet. The stretching process in the first heating section and the stretching process in the second heating section are monitored and regulated in such a manner that the necessary stretching of the pipe takes place primarily in the first heating section, and the stretching of the pipe in the second heating section is subjected to zero adjustment. In this case, the height of the deflection roller(s) of the cross-linking furnace and the angle of the heating sections to the horizontal plane can be height-adjustable.