Abstract: The present disclosure relates to a measuring system for measuring a measured object, in particular a plastic profile, said measuring system comprising: an antenna arrangement of THz transceivers each at times actively emitting a THz transmission beam and passively receiving reflected THz radiation, where said antenna arrangement outputs measuring signals of the measurements of the THz transceivers, an adjustment means for adjusting the antenna arrangement into several measuring positions along an adjustment direction, a control and evaluation device for receiving and evaluating the measuring signals which is configured such that the measuring signals are evaluated by means of a synthetic aperture radar evaluation process and a virtual model of the boundary surfaces of the measured object is created, and subsequently the control and evaluation device determines layer thicknesses between the boundary surfaces from the virtual model.

Abstract: The invention relates to a preferably portable THz measuring apparatus (1) for determining impurities (3) in a, in particular, stationary measured object (2), the THz measuring apparatus (1) comprising: an antenna array (4) including at least one active THz transmitter, e.g. transceiver (12), emitting a THz transmission beam (15) along an optical axis (A), and a plurality of THz receivers (14), arranged under a fixed spatial arrangement in relation to the THz transmitter (12) and synchronised with the THz receiver, detect reflected THz radiation (16) and putting out THz measuring signals (S1), a controller device (5), receiving the THz measuring signals (S1) and determining impurities (3) as reflections having occurred outside ordinary boundary surfaces (2a, 2b) of the measured object (2). Hereby, the THz-Receiver (14) may also transmit temporarily, in particular alternatingly.

Abstract: The invention relates to a terahertz measuring apparatus (1) for run-time measurements of test objects (8), in particular, for layer thickness measurements and distance measurements of the test objects (8), whereby the terahertz measuring apparatus (1) comprises: a transmitter and receiver unit (2) for emitting a terahertz radiation (10) along an optical axis (A) and for receiving reflected terahertz radiation, a controller and evaluation unit (3) for driving the transmitter and receiver unit (2) and evaluating measuring signals (M) of the transmitter and receiver unit (2).

Abstract: The invention relates to a terahertz measuring apparatus (1) for measuring a test object (2) by means of a run-time measurement while determining at least one distance (d1, d2, d3, d4), said terahertz measuring apparatus (1) comprising: a terahertz transmitter and receiver unit (3) for emitting terahertz radiation (5) and detecting the terahertz radiation reflected by the test object (2), and an evaluation unit (12) for determining a run-time of the terahertz radiation and at least one distance of the test object (2), Hereby, it is provided, that at least one, preferably several passive terahertz receiver devices (4) are provided the optical axes (C-4) of which are arranged shifted or angled in relation to the optical axis (C-3) of the terahertz transmitter and receiver unit (3) and detect a second reflected terahertz radiation (6b) emitted by the terahertz transmitter and receiver unit (3) and reflected on the test object (2), a data connection (10) for synchronising the terahertz transmitter and receive

Abstract: The invention relates to a THz measuring device (1) for determining at least one layer thickness (a1, a2, a3, a4) of a test object (20, 120, 220), the measuring device Messgerät (1) comprising: a THz transmitter and receiver unit (14) for emitting THz radiation (15) along an optical axis (A) and for receiving reflected THz radiation (16) along the optical axis (A), a controller unit (10) for driving the transmitter and receiver unit (14) Hereby, the THz measuring device (1) is preferably portable including a grip region (34) for grabbing and positioning by the operator, whereby it comprises, at a front end are (5), in particular, a moulded screen (5), a support contour (7) including several support points (P, P1, P2, P3, P4) for being applied to a curved surface (18) of the test object (20, 120, 220), for perpendicular positioning on the surface (18, 118, 218).

Abstract: The invention relates to a terahertz measuring apparatus (1) for run-time measurements of test objects (8), in particular, for layer thickness measurements and distance measurements of the test objects (8), whereby the terahertz measuring apparatus (1) comprises: a transmitter and receiver unit (2) for emitting a terahertz radiation (10) along an optical axis (A) and for receiving reflected terahertz radiation, a controller and evaluation unit (3) for driving the transmitter and receiver unit (2) and evaluating measuring signals (M) of the transmitter and receiver unit (2).

Abstract: The invention relates to a method and a terahertz measuring apparatus for measuring a layer thickness and/or a distance, wherein at least one terahertz beam (7a) is radiated from a terahertz transmission and reception unit (4) along an optical axis (C) onto the measurement object (2, 102) and terahertz radiation (7) that has passed through at least one layer (3) of the measurement object (2, 102) and having been reflected is detected wherein a measurement signal (A) of the detected reflected terahertz radiation (7b) is evaluated and a layer thickness (d) is ascertained from a propagation time difference (t2?t1) of the radiation (7) reflected at boundary layers (2a, 2b) of the layer (3).

Abstract: The invention relates to a terahertz measuring device (1) for measuring a test object (7), comprising: a THz transmitter and receiver unit (2) for emitting terahertz radiation (3) at a spatial angle of emittance (4) along an optical axis (A), receiving reflected terahertz radiation (8) and generating a signal amplitude (S) as a function of the time or frequency (t, f), and a controller and evaluator device (12) for receiving and evaluating the signal amplitude (S). Hereby, the controller and evaluator device (12) determines defects (10, 110) of the test object (7) from the signal amplitude (S). In particular, it is possible to mask a core area (4a) of the emitted terahertz radiation (3). An alternative measuring arrangement can reveal defects also by injecting the THz radiation at a right angle in that additional measuring peaks are detected which cannot be associated with the layer thickness measurement as such.

Abstract: The invention relates to a terahertz measuring apparatus (1) for measuring a test object (2) by means of a run-time measurement while determining at least one distance (d1, d2, d3, d4), said terahertz measuring apparatus (1) comprising: a terahertz transmitter and receiver unit (3) for emitting terahertz radiation (5) and detecting the terahertz radiation reflected by the test object (2), and an evaluation unit (12) for determining a run-time of the terahertz radiation and at least one distance of the test object (2), Hereby, it is provided, that at least one, preferably several passive terahertz receiver devices (4) are provided the optical axes (C-4) of which are arranged shifted or angled in relation to the optical axis (C-3) of the terahertz transmitter and receiver unit (3) and detect a second reflected terahertz radiation (6b) emitted by the terahertz transmitter and receiver unit (3) and reflected on the test object (2), a data connection (10) for synchronising the terahertz transmitter and receive

Abstract: The invention relates to a THz measuring device (1) for determining at least one layer thickness (a1, a2, a3, a4) of a test object (20, 120, 220), the measuring device Messgerät (1) comprising: a THz transmitter and receiver unit (14) for emitting THz radiation (15) along an optical axis (A) and for receiving reflected THz radiation (16) along the optical axis (A), a controller unit (10) for driving the transmitter and receiver unit (14) Hereby, the THz measuring device (1) is preferably portable including a grip region (34) for grabbing and positioning by the operator, whereby it comprises, at a front end are (5), in particular, a moulded screen (5), a support contour (7) including several support points (P, P1, P2, P3, P4) for being applied to a curved surface (18) of the test object (20, 120, 220), for perpendicular positioning on the surface (18, 118, 218).

Abstract: The invention relates to a terahertz measuring device (1) for measuring a test object (7), comprising: a THz transmitter and receiver unit (2) for emitting terahertz radiation (3) at a spatial angle of emittance (4) along an optical axis (A), receiving reflected terahertz radiation (8) and generating a signal amplitude (S) as a function of the time or frequency (t, f), and a controller and evaluator device (12) for receiving and evaluating the signal amplitude (S). Hereby, the controller and evaluator device (12) determines defects (10, 110) of the test object (7) from the signal amplitude (S). In particular, it is possible to mask a core area (4a) of the emitted terahertz radiation (3). An alternative measuring arrangement can reveal defects also by injecting the THz radiation at a right angle in that additional measuring peaks are detected which cannot be associated with the layer thickness measurement as such.

Abstract: The present invention relates to a seal device for a negative pressure calibrating unit in a extrusion line for producing profiled plastic sections, in particular pipes whereby the inner face of a seal rests against the circumference of the extruded profiled section in a formfitting manner and the seal is radially supported on the profiled section in order to apply a sealing force. It is the object of the invention to provide another similar device which is very easily constructed and can be produced inexpensively. This task is solved in that the seal is a porous and elastic foam body (13), the surfaces (17, 19) of that are exposed to the atmosphere are coated with an air-tight coating (21).

Abstract: The invention relates to a method and a terahertz measuring apparatus for measuring a layer thickness and/or a distance, wherein at least one terahertz beam (7a) is radiated from a terahertz transmission and reception unit (4) along an optical axis (C) onto the measurement object (2, 102) and terahertz radiation (7) that has passed through at least one layer (3) of the measurement object (2, 102) and having been reflected is detected wherein a measurement signal (A) of the detected reflected terahertz radiation (7b) is evaluated and a layer thickness (d) is ascertained from a propagation time difference (t2?t1) of the radiation (7) reflected at boundary layers (2a, 2b) of the layer (3).