Patents Assigned to Inopla Inc.
  • Patent number: 7374471
    Abstract: An apparatus and method for polishing objects, such as semiconductor wafers, utilizes one or more pivotable load-and-unload cups to transfer the objects to and/or from one or more object carriers to polish the objects. Each pivotable load-and-unload cup may be configured to transfer the objects to and/or from a single object carrier. Alternatively, each pivotable load-and-unload cup may be configured to transfer the objects to and/or from two object carriers. The pivotable load-and-unload cups may be configured to be pivoted about one or more pivoting points over at least one polishing surface, such as a polishing pad surface.
    Type: Grant
    Filed: January 27, 2004
    Date of Patent: May 20, 2008
    Assignee: Inopla Inc.
    Inventor: In Kwon Jeong
  • Patent number: 7367866
    Abstract: An apparatus and method for polishing objects, such as semiconductor wafers, utilizes pivotable load/unload cups to transfer the objects to object carriers to polish the objects on at least one polishing surface. The pivoting axes of the pivotable load/unload cups are located between the object carriers.
    Type: Grant
    Filed: August 18, 2005
    Date of Patent: May 6, 2008
    Assignee: InoPla Inc
    Inventor: In Kwon Jeong
  • Patent number: 7364496
    Abstract: A polishing head and method for handling and polishing semiconductor wafers uses a base structure with at least one recess region and an outer flexible membrane that can conform to the at least one recess region to form at least one depression to hold a semiconductor wafer onto the outer flexible membrane when suction is applied to the at least one depression.
    Type: Grant
    Filed: February 28, 2007
    Date of Patent: April 29, 2008
    Assignee: Inopla Inc.
    Inventors: David E. Berkstresser, Jerry J. Berkstresser, Jino Park, In-Kwon Jeong
  • Patent number: 7238614
    Abstract: Methods for fabricating one or more metal (e.g., copper) damascene structures in a semiconductor wafer use at least three polishing steps to reduce erosion topography in the resulting metal damascene structures and/or increase throughput. The polishing steps may be performed at four polishing units of a polishing apparatus, which may include one or more pivotable load/unload cups to transfer the semiconductor wafer between some of the polishing units.
    Type: Grant
    Filed: November 8, 2005
    Date of Patent: July 3, 2007
    Assignee: Inopla Inc.
    Inventor: In Kwon Jeong
  • Patent number: 7223153
    Abstract: An apparatus and method for polishing objects, such as semiconductor wafers, utilizes one or more polishing surfaces, multiple wafer carriers and at least one load-and-unload cup. The load-and-unload cup may be configured to move to and from the wafer carriers in a pivoting manner. The load-and-unload cup may be configured to move to and from the wafer carriers in a linear reciprocating manner. The wafer carriers may be configured to move to and from the load-and-unload cup in a pivoting manner. The wafer carriers may be configured to move to and from the load-and-unload cup in a linear reciprocating manner.
    Type: Grant
    Filed: April 21, 2004
    Date of Patent: May 29, 2007
    Assignee: Inopla Inc.
    Inventor: In Kwon Jeong