Patents Assigned to INRIA-INST. NAT'L DE RECH. EN INFORM. ET EN AUTOM.
  • Publication number: 20080278497
    Abstract: The invention concerns a method of obtaining simulated parameters ( pos(t), vit(t), acc(t), par(t)) able to characterise the movement of an articulated structure provided with sensors, characterised in that the method comprises the following steps: calculating, from estimated movement state parameters of the structure, estimated measurement data ( H(t), ?(t)), each estimated measurement data item corresponding to a measurement delivered by a sensor, difference (9) between the measurements delivered by the sensors and the estimated measurement data that correspond to them, global mathematical processing of the observer type (10) of the data issuing from the difference in order to obtain at least one estimated difference for an estimated movement state parameter, and adding (11) the estimated difference for the estimated movement state parameter and the estimated movement state parameter that corresponds to it in order to form a simulated parameter.
    Type: Application
    Filed: April 23, 2008
    Publication date: November 13, 2008
    Applicants: COMMISSARIAT A L'ENERGIE ATOMIQUE, INRIA-INST. NAT'L DE RECH. EN INFORM. ET EN AUTOM.
    Inventors: Fabien Jammes, Bruno Flament, Pierre-Brice Wieber