Abstract: A system and method for measuring an interferometric signal from a swept-wavelength interferometer by scanning a tunable laser source over two wavelength ranges, whose centers are separated substantially more than the length of wavelength ranges. The spatial resolution of the measurement is determined by the inverse of the wavelength separation between a first and second wavelength region, as well as by the wavelength range of the first and second regions. An electronically tunable laser may be utilized to produce two wavelength ranges that are widely separated in wavelength. Such a system and method has wide applications to the fields of optical frequency domain reflectometry (OFDR) and swept-wavelength optical coherence tomography (OCT), for example.

Abstract: A system (10, 20) and method including a wavelength tuning mechanism and a laser path length tuning mechanism for reducing discontinuities in a sweep range. A processor (14) is coupled to a wavelength monitoring device (18) and the tuning mechanisms. The processor analyzes data from the wavelength monitor to adjust the wavelength tuning and cavity length tuning at discontinuities in the wavelength sweep to reduce the discontinuities.

Abstract: A method and a system for characterization of optical components through characterized decomposition of an optical device includes: directing incident light over a range of wavelengths to a device under test, wherein the incident light includes a primary signal and at least one sideband signal, the distance between the primary signal and any one of the sideband signals is substantially larger than the width of the band pass area of the device under test; detecting output light from the device under test to obtain a detected signal; correcting the detected signal to account errors associated with the sideband signal.

Abstract: A system and method for passive combination of two or more laser sources (e.g., sampled grating distributed Bragg reflector (SG-DBR) lasers) into a single sweep that encompasses the combined range of the wavelengths of each laser source.

Abstract: A system and method to determine data sets of front mirror current, back mirror current and phase current that change the wavelength output by a semiconductor laser in a prescribed trajectory versus time, while maintaining the maximum side-mode suppression ratio at each point during the sweep.

Abstract: A system and method for passive combination of two or more laser sources (e.g., sampled grating distributed Bragg reflector (SG-DBR) lasers) into a single sweep that encompasses the combined range of the wavelengths of each laser source.

Abstract: A system and method for sweeping electromagnetic radiation over a first coherence length and a second length over a range of wavelengths to generate an image. Electromagnetic radiation having a first coherence length is generated and swept over a range of wavelengths. Electromagnetic radiation having a second coherence length is generated and swept over a range of wavelengths. The electromagnetic radiation is splitting through a reference path and a sample path; Electromagnetic radiation returned from the reference path and the sample path is detected, wherein the detector generates output signals corresponding to the received electromagnetic radiation. In one embodiment, the output signals are processed to generate an image. The image may be interleaved with data corresponding to the electromagnetic radiation having the first coherence length and the second coherence length.

Abstract: A system and method for adjusting the coherence length of a tunable laser to optimize measurements and reduce artifacts. A tuning element of the laser system modulates, adjusts, or controls parameters associate with the tunable laser, such that the output wavelength of the tunable laser is modulated or adjusted over a wavelength range within a time interval. Modulation of the parameter has the effect of increasing a linewidth of the tunable laser.

Abstract: A system and method for correcting non-linearities in the output of a tunable laser over a sweep range. Electromagnetic radiation is directed over a range of wavelengths to a measurement system from the tunable laser source, wherein the measurement system collects data over the range of wavelengths. The electromagnetic radiation emitted over the range of wavelengths is monitored. A non-linearity in one or more wavelengths over the range of wavelengths is determined. A signal is transmitted to the measurement system to cease collecting data when the one or more wavelengths having the non-linearity is output from the tunable laser source or the data is ignored.

Abstract: A method and a system for characterization of optical components through characterized decomposition of an optical device includes: directing incident light over a range of wavelengths to a device under test, wherein the incident light includes a primary signal and at least one sideband signal, the distance between the primary signal and any one of the sideband signals is substantially larger than the width of the band pass area of the device under test; detecting output light from the device under test to obtain a detected signal; correcting the detected signal to account errors associated with the sideband signal.