Patents Assigned to Insitec Measurement Systems
  • Method for measuring particle size in the presence of multiple scattering
    Patent number: 5619324
    Abstract: A method applicable to an ensemble laser diffraction (ELD) instrument computes a particle size distribution in real time after correction for the multiple scattering phenomena. In one embodiment, a numerical method, similar to the Newton's method, is provided to iteratively calculate the single scattering mode. The present method is hence suitable for use, with high accuracy, in real time controlling and monitoring applications.
    Type: Grant
    Filed: December 29, 1995
    Date of Patent: April 8, 1997
    Assignee: Insitec Measurement Systems
    Inventors: Thomas L. Harvill, Donald J. Holve