Patents Assigned to Insitutec, Inc.
  • Patent number: 7900506
    Abstract: The present invention provides a multi-dimensional standing wave probe for microscale and nanoscale measurement, manipulation, and surface modification, including: a filament having a first free end and a second end that is attached to at least one actuator to apply oscillation cycles to the filament; wherein the oscillation of the filament during at least one complete cycle of oscillation of the actuator causes the free end to move in a multi-dimensional envelope, producing a defined virtual probe tip at the free end, wherein a shape of the virtual probe tip is defined by both a characteristic shape of the oscillation of the free end and a geometry of the filament. Optionally, the actuator includes a monolithic crystal actuator. Preferably, the monolithic crystal actuator includes a crystal having zero grain boundaries. The monolithic crystal actuator also includes a plurality of thin flexure structures.
    Type: Grant
    Filed: December 14, 2007
    Date of Patent: March 8, 2011
    Assignee: Insitutec, Inc.
    Inventors: Shane C. Woody, Marcin B. Bauza, Stuart T. Smith
  • Patent number: 7735358
    Abstract: The present invention provides a self-sensing tweezer device for micro and nano-scale manipulation, assembly, and surface modification, including: one or more elongated beams disposed in a first configuration; one or more oscillators coupled to the one or more elongated beams, wherein the one or more oscillators are operable for selectively oscillating the one or more elongated beams to form one or more “virtual” probe tips; and an actuator coupled to the one or more elongated beams, wherein the actuator is operable for selectively actuating the one or more elongated beams from the first configuration to a second configuration.
    Type: Grant
    Filed: June 15, 2007
    Date of Patent: June 15, 2010
    Assignee: Insitutec, Inc.
    Inventors: Marcin B. Bauza, Shane C. Woody, Stuart T. Smith
  • Patent number: 7308747
    Abstract: A small-scale positioning device employing a platform, a levering mechanism and a floating actuator device. The platform is movably attached to a fixed frame by a lever, a pair of levers, or more. The floating actuator device is coupled between at least one lever and the platform. When the actuator device is activated, it generates a force on the platform and an equal but opposite force on the levering mechanism, causing one or more levers to rotate around their respective fulcrums, thereby controlling the position of the movable platform relative to the fixed frame. The amount of displacement of the platform is dependent upon the effective expansion or contraction of the actuator device and the lever ratio. If the pair of levers are symmetrical, then motion is created in only a single degree of motion. Flexures may be included to prevent motion in unwanted directions.
    Type: Grant
    Filed: January 21, 2004
    Date of Patent: December 18, 2007
    Assignee: Insitutec, Inc.
    Inventors: Stuart T. Smith, Shane C. Woody
  • Patent number: 7278297
    Abstract: An oscillating probe of an elongated rod, having a first free end, and a second end that is attached to at least one actuator to apply oscillation cycles to the rod. Oscillation of the elongated rod during at least one complete cycle of oscillation of the actuator causes the free end to move in at least one-dimensional envelope, producing a defined virtual probe tip geometry at the free end. The probe is connected to a system for utilizing information sensed as the free end is placed near a surface.
    Type: Grant
    Filed: November 16, 2004
    Date of Patent: October 9, 2007
    Assignee: Insitutec, Inc.
    Inventors: Marcin B. Bauza, Robert J. Hocken, Stuart T. Smith
  • Patent number: RE41057
    Abstract: An apparatus for profiling the surface of a workpiece, including a probe adapted to make contact with the surface of a workpiece, a sensor for determining or deriving the force between the probe and the workpiece surface, an actuator that adjusts the position of the probe along an axis, which is generally perpendicular to the surface of the workpiece, in order to maintain a constant force between the probe and the surface, and a closed control loop, including a controller that controls the operation of the actuator based on information from the sensor.
    Type: Grant
    Filed: April 5, 2006
    Date of Patent: December 29, 2009
    Assignee: Insitutec, Inc.
    Inventors: Stuart T. Smith, Marcin B. Bauza, Pavan Jain, Shane C. Woody