Patents Assigned to Inspectech Ltd.
  • Method and apparatus for analyzing cuts
    Patent number: 6192289
    Abstract: A system for analyzing the quality of the sawing of a material which includes a scanning unit, a cut parameter identifier and a cut analyzer. The scanning unit scans along cuts of the material and views at least a portion of a cut. The cut parameter identifier identifies and stores parameters of the viewed cut portion. The cut analyzer analyzes the parameters of a multiplicity of viewed cut portions and which determines the quality of the cuts therefrom.
    Type: Grant
    Filed: February 13, 1998
    Date of Patent: February 20, 2001
    Assignee: Inspectech Ltd.
    Inventors: Michael Geffen, Abraham Ben-Har